Special Issue "Diagnostics and Fault Tolerance in DC-DC Converters and Related Industrial Electronics Technologies"

A special issue of Electronics (ISSN 2079-9292).

Deadline for manuscript submissions: 20 November 2022 | Viewed by 92

Special Issue Editors

Dr. Fernando Bento
E-Mail Website
Guest Editor
CISE|University of Beira Interior, Calçada Fonte do Lameiro, P-6200-001 Covilhã, Portugal
Interests: energy efficiency analysis; fault diagnostic; fault tolerance in electronic power converters; dc–dc converters
Special Issues, Collections and Topics in MDPI journals

Special Issue Information

Dear Colleagues,

The deployment of DC energy systems is an attractive alternative to conventional AC-based energy distribution systems, improving the efficiency of energy supplies and promoting renewable energies. Within DC energy systems, industrial electronics and particularly DC–DC converters are the key technologies that establish the interface between the multiple individual units of DC energy systems. Semiconductors and electrolytic capacitors, as critical components of DC–DC power converters, are particularly susceptible to suffering faults, which have a critical impact on converter operation. The implementation of diagnostic, prognostic, and fault-tolerant strategies, which are able to effectively deal with the multiple failure modes prone to occurring in DC–DC converters, is a challenging goal and is yet to be fully achieved. Accordingly, novel advancements in the diagnostics, prognostics and fault tolerance of DC–DC converters and related industrial electronics technologies require further attention.

This Special Issue focuses on the discussion of emerging solutions suitable for leveraging the availability, reliability, and robustness of DC–DC industrial power electronics technologies. Potential topics include, but are not limited to:

- Fault diagnostics and prognostics in DC–DC converters;
- Fault analysis in DC–DC converters;
- Fault-tolerant DC–DC converter topologies;
- Optimized control strategies for enhanced fault tolerance;
- Reliability predictions and the physics of failure of DC–DC converters;
- Thermal analysis of fault-tolerant DC–DC converters;
- Efficiency analysis and improvement of fault-tolerant DC–DC converters;
- Applications for fault-tolerant DC–DC converters (renewables integration, LED lighting, EV charging, etc.);
- Fault diagnostics in sensors;
- Reliable wide-bandgap technologies.

Prof. Dr. Antonio J. Marques Cardoso
Dr. Fernando Bento
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Electronics is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2000 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.


  • DC–DC converters
  • efficiency
  • reliability
  • diagnostics
  • prognostics
  • fault tolerance

Published Papers

This special issue is now open for submission.
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