Crystal Growth of III–V Semiconductors

A special issue of Crystals (ISSN 2073-4352). This special issue belongs to the section "Inorganic Crystalline Materials".

Deadline for manuscript submissions: 30 August 2025 | Viewed by 1204

Special Issue Editors


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Guest Editor
Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
Interests: compound semiconductors; epitaxial growth; MOCVD; MBE; metamorphic; hetero-epitaxy; optoelectronics;

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Guest Editor
Polymer Energy Materials Laboratory, School of Chemical Engineering, Chonnam National University, Gwangju 61186, Korea
Interests: synthesis; 1D and 3D nanostructures; perovskite solar cells; solar cells
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Special Issue Information

Dear Colleagues,

III–V semiconductors are binary, ternary, quaternary, quinary (and so on) alloys, containing elements from groups III (Al, Ga, In, B, and Tl) and V (N, P, As, Sb, and Bi) in the periodic table. They are widely applied in high-performance optoelectronic and electronic devices due to their superior electronic and optical properties, including high electron mobility, direct band gap, low exciton binding energy, and the ability to cover a vast bandgap energy range. The properties enable high speed, high temperature, high current, and high voltage in optoelectronic devices ranging from the ultraviolet to the terahertz band. 

The epitaxial growth of III–V semiconductors is fundamental to these devices; high single-crystal quality, atomic-layer-scale controllability, and mass productive ability are provided by the utilization of metalorganic chemical vapor deposition, molecular beam epitaxy, liquid phase epitaxy, hydride vapor phase epitaxy, and others. Phosphides and arsenides have been fully developed and widely used in the communication, industry, energy, aerospace, defense, automotive, and healthcare fields. Nitrides are newly developed, and exciting breakthroughs have also been made regarding antimonides. 

Coherent growth is the growth mode of compound semiconductor thin films, and the lattice mismatch between substrates and epitaxial layers fundamentally restrains the crystal quality. Recently, metamorphic growth, via graded buffer layers and the two-step growth technique, has been developed to overcome this limitation. Nitride growth on sapphire is one benefit of this technique. It can also provide the ability to grow III–V on silicon, which could be the best solution for the creation of light sources in silicon photonics. 

The present Special Issue, entitled “Crystal Growth of III–V Semiconductors,” offers researchers in the field of III–V compound growth the opportunity to present new approaches that would enable better quality to be achieved, overcome the traditional limitation of coherent growth, and realize new applications via novel material combinations. The current status and roadmap for III–V semiconductor materials’ growth could also be determined.

Dr. Xin Wei
Dr. Sawanta S. Mali
Guest Editors

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Keywords

  • epitaxy
  • MOCVD 
  • MBE
  • III–V semiconductor

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Published Papers (1 paper)

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Research

10 pages, 2586 KiB  
Article
AlGaN-Based Ultraviolet PIN Photodetector Grown on Silicon Substrates Using SiN Nitridation Process and Step-Graded Buffers
by Jian Li, Yan Maidebura, Yang Zhang, Gang Wu, Yanmei Su, Konstantin Zhuravlev and Xin Wei
Crystals 2024, 14(11), 952; https://doi.org/10.3390/cryst14110952 - 31 Oct 2024
Viewed by 834
Abstract
The integration of aluminum gallium nitride (AlGaN) with silicon substrates attracts significant attention due to the superior UV sensitivity of AlGaN and the cost-effectiveness as well as mechanical robustness of silicon. A PIN ultraviolet photodetector with a peak detection wavelength of 274 nm [...] Read more.
The integration of aluminum gallium nitride (AlGaN) with silicon substrates attracts significant attention due to the superior UV sensitivity of AlGaN and the cost-effectiveness as well as mechanical robustness of silicon. A PIN ultraviolet photodetector with a peak detection wavelength of 274 nm is presented in this paper. By employing a SiN nucleation layer and a step-graded buffer, a high-quality AlGaN-based photodetector structure with a dislocation density of 2.4 × 109/cm2 is achieved. A double-temperature annealing technique is utilized to optimize the Ohmic contact of the n-type AlGaN. The fabricated UV photodetector attains a dark current of 0.12 nA at −1 V and a peak responsivity of 0.12 A/W. Full article
(This article belongs to the Special Issue Crystal Growth of III–V Semiconductors)
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