Special Issue "Dimensional Micro and Nanometrology"
Deadline for manuscript submissions: closed (15 February 2017)
Prof. Dr. Richard Leach
Working at the micro- and nano-scales demands an understanding of the high-precision measurement techniques that make nanotechnology and advanced manufacturing possible. This Special Issue on dimensional micro- and and nanometrology presents the latest advances in these techniques and is aimed at a broad range of scientists and engineers involved in nanotechnology and advanced manufacturing research. The Special Issue addresses new and emerging measurement and anlysis technologies, and recent advances in standards and regulatory frameworks. Subject areas include, but are not limited to: Traceability, uncertainty, calibration, verification and standards; precision instrumentation design and theory; optical instruments; scanning probe microscopies; particle beam microscopy; angle, displacement and coordinate metrology; surface topography measurement; and aspects of in-line measurement and control in nanotechnology and advanced manufacturing.
Prof. Richard Leach
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All papers will be peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Applied Sciences is an international peer-reviewed open access semimonthly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 1500 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
- optical instruments
- scanning probe microscopies
- particle beam microscopy
- coordinate metrology
- surface topography measurement
- in-line measurement