You are currently viewing a new version of our website. To view the old version click .

Advances in Nondestructive Testing and Evaluation

Special Issue Information

Dear Colleagues,

Non-destructive testing and evaluation (NDT&E) is the leading technique for determining the appropriate quality and reliability of various materials, especially components, devices, and structures, by enabling the evaluation and localization of anomalies (manufacturing imperfections, defects, corrosion, deformation, discontinuities, external and internal cracks, etc.) during production and fabrication, and during products’ life cycles, without harming the original part. NDT&E technologies include ultrasonic testing (UT), magnetic particle testing (MT), magnetic flux leakage testing (MFLT), eddy current testing (ECT), radiation testing (RT), penetrant testing (PT) and visual testing (VT), along with a set of other testing techniques for industrial applications. Additionally, NDT&E technologies offer a high level of safety, sustainability and economic efficiency. On the other hand, they play an important role in today's manufacturing industry, primarily in Industry 4.0.

The purpose of this special issue is to shed light on recent advances in the field of non-destructive testing and evaluation, including novel and emerging approaches for non-destructive testing and evaluation, inverse problem evaluation, and pioneering applications for a vast array of industries and laboratories.

Owing to the requirement for technical breakthrough in the field of non-destructive testing and evaluation, numerous endeavors are being undertaken, including but not limited to:

(1) Materials characterization;

(2) Innovation application and methodologies in the field of NDT;

(3) Evaluation using inverse problem;

(4) Integration of test methods using conventional NDT&E methods;

(5) Ultra-precise sensor (sensitivity and resolution) development using advanced technology in electrical and electronic fields;

(6) Ultra-fast inspection (real-time NDT and high-speed flaw recognition);

(7) Automation of the inspection process (applying robot technology);

(8) Visualization of test results (2-D or 3-D visualization);

(9) Preservation and management of test results;

(10) Application of artificial intelligence.

Applied Sciences has scheduled a Special Issue titled "Advances in Non-destructive Testing and Evaluation" which will gather the results of a great number of researchers and engineers to address the ongoing challenges and technological advances in NDT&E.

For articles published in Applied Sciences (Impact Factor 2.679), the authors are required to support the financial charge associated with the open-access format. We believe that this Special Issue will be an excellent opportunity to contribute to the future development of the non-destructive testing and evaluation industry and laboratories.

We look forward to your involvement.

Prof. Dr. Jinyi Lee
Dr. Azouaou Berkache
Dr. Minhhuy Le
Dr. Zheng Tong
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 250 words) can be sent to the Editorial Office for assessment.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Applied Sciences is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • nondestructive testing
  • visible inspection
  • infrared radiation
  • X-ray and X-ray backscatter
  • electro-magnetic imaging
  • phase array UT
  • artificial intelligence
  • evaluation
  • reliability
  • probability of detection
  • ground-penetrating radar
  • deep learning
  • information fusion of multiple NDT&E methods
  • uncertainty on NDT&E data

Benefits of Publishing in a Special Issue

  • Ease of navigation: Grouping papers by topic helps scholars navigate broad scope journals more efficiently.
  • Greater discoverability: Special Issues support the reach and impact of scientific research. Articles in Special Issues are more discoverable and cited more frequently.
  • Expansion of research network: Special Issues facilitate connections among authors, fostering scientific collaborations.
  • External promotion: Articles in Special Issues are often promoted through the journal's social media, increasing their visibility.
  • e-Book format: Special Issues with more than 10 articles can be published as dedicated e-books, ensuring wide and rapid dissemination.

Published Papers

Get Alerted

Add your email address to receive forthcoming issues of this journal.

XFacebookLinkedIn
Appl. Sci. - ISSN 2076-3417