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Intelligent Fault Diagnosis of Rotating Machinery

This special issue belongs to the section “Mechanical Engineering“.

Special Issue Information

Dear Colleagues,

Diverse rotating machineries, as crucial entities, are widely integrated in high-tech equipment of the Industry 4.0 era. Their performance is critical for the safety, precision, and availability of high-tech equipment. Timely diagnosing abnormal behavior and identifying fault locations are essential for in-service operation. To date, many new concepts, state-of-the-art deep learning tools, and smart IoT hardware have emerged and demonstrated great potential for intelligent fault diagnosis of rotating machinery.

This Special Issue will collect all research on intelligent fault diagnosis methods and applications in rotating machineries, including (but not limited to):

  • Advanced sensing and perception;
  • Advanced signal processing and deep feature mining;
  • Knowledge discovery;
  • Incipient anomaly detection;
  • Deep-learning-assisted methods in fault diagnosis;
  • Unbalanced dataset and mitigation methods;
  • Transfer learning and domain adaption;
  • Open-source datasets and dissemination;
  • Adaptive and online learning;
  • Physics-informed machine learning and hybrid methods;
  • Digital-twin-based fault diagnosis;
  • Failure prognosis;
  • Hardware and IoT system for intelligent fault diagnosis;
  • New applications of rotating machinery diagnosis.

Dr. Laifa Tao
Dr. Jie Liu
Dr. Shuai Zhao
Guest Editors

Manuscript Submission Information

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Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • machine learning
  • artificial intelligence
  • digital twin (modeling and simulation)
  • data-driven modeling
  • physics-informed modeling
  • pattern recognition
  • condition monitoring
  • fault diagnosis
  • health assessment
  • prognostics

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Appl. Sci. - ISSN 2076-3417