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Journal: J. Imaging, 2025
Volume: 11
Number: 17
Article:
Supervised and Self-Supervised Learning for Assembly Line Action Recognition
Authors:
by
Christopher Indris, Fady Ibrahim, Hatem Ibrahem, Götz Bramesfeld, Jie Huo, Hafiz Mughees Ahmad, Syed Khizer Hayat and Guanghui Wang
Link:
https://www.mdpi.com/2313-433X/11/1/17
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