Lee, G.; Kim, S.; Kim, J.-s.; Kim, J.
Deep Learning-Based Mapping of Textile Stretch Sensors to Surface Electromyography Signals: Multilayer Perceptron, Convolutional Neural Network, and Residual Network Models. Processes 2025, 13, 601.
https://doi.org/10.3390/pr13030601
AMA Style
Lee G, Kim S, Kim J-s, Kim J.
Deep Learning-Based Mapping of Textile Stretch Sensors to Surface Electromyography Signals: Multilayer Perceptron, Convolutional Neural Network, and Residual Network Models. Processes. 2025; 13(3):601.
https://doi.org/10.3390/pr13030601
Chicago/Turabian Style
Lee, Gyubin, Sangun Kim, Ji-seon Kim, and Jooyong Kim.
2025. "Deep Learning-Based Mapping of Textile Stretch Sensors to Surface Electromyography Signals: Multilayer Perceptron, Convolutional Neural Network, and Residual Network Models" Processes 13, no. 3: 601.
https://doi.org/10.3390/pr13030601
APA Style
Lee, G., Kim, S., Kim, J.-s., & Kim, J.
(2025). Deep Learning-Based Mapping of Textile Stretch Sensors to Surface Electromyography Signals: Multilayer Perceptron, Convolutional Neural Network, and Residual Network Models. Processes, 13(3), 601.
https://doi.org/10.3390/pr13030601
