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Journal: Electronics, 2020
Volume: 9
Number: 1154
Article:
Analysis of the Results of Heel-Rise Test with Sensors: A Systematic Review
Authors:
by
Ivan Miguel Pires, Vasco Ponciano, Nuno M. Garcia and Eftim Zdravevski
Link:
https://www.mdpi.com/2079-9292/9/7/1154
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