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Journal: Electronics, 2020
Volume: 9
Number: 797

Article: Test Case Generation Method for Increasing Software Reliability in Safety-Critical Embedded Systems
Authors: by Bongjoo Koo, Jungho Bae, Seogbong Kim, Kangmin Park and Hyungshin Kim
Link: https://www.mdpi.com/2079-9292/9/5/797

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