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Journal: Electronics, 2020
Volume: 9
Number: 797
Article:
Test Case Generation Method for Increasing Software Reliability in Safety-Critical Embedded Systems
Authors:
by
Bongjoo Koo, Jungho Bae, Seogbong Kim, Kangmin Park and Hyungshin Kim
Link:
https://www.mdpi.com/2079-9292/9/5/797
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