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Journal: Electronics, 2024
Volume: 13
Number: 4322
Article:
Fake Review Detection Model Based on Comment Content and Review Behavior
Authors:
by
Pengfei Sun, Weihong Bi, Yifan Zhang, Qiuyu Wang, Feifei Kou, Tongwei Lu and Jinpeng Chen
Link:
https://www.mdpi.com/2079-9292/13/21/4322
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