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Journal: Electronics, 2023
Volume: 12
Number: 3019

Article: Memristor-Based D-Flip-Flop Design and Application in Built-In Self-Test
Authors: by Guangzhen Dai, Wenxin Xie, Xingyan Du, Mingjun Han, Tianming Ni and Daohua Wu
Link: https://www.mdpi.com/2079-9292/12/14/3019

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