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Mirabella N, Grosso M, Franchino G, Rinaudo S, Deretzis I, La Magna A, Sonza Reorda M. An Experimental Evaluation of Resistive Defects and Different Testing Solutions in Low-Power Back-Biased SRAM Cells. Electronics. 2022; 11(2):203. https://doi.org/10.3390/electronics11020203

Mirabella, Nunzio, Michelangelo Grosso, Giovanna Franchino, Salvatore Rinaudo, Ioannis Deretzis, Antonino La Magna, and Matteo Sonza Reorda. 2022. "An Experimental Evaluation of Resistive Defects and Different Testing Solutions in Low-Power Back-Biased SRAM Cells" Electronics 11, no. 2: 203. https://doi.org/10.3390/electronics11020203

Mirabella, N., Grosso, M., Franchino, G., Rinaudo, S., Deretzis, I., La Magna, A., & Sonza Reorda, M. (2022). An Experimental Evaluation of Resistive Defects and Different Testing Solutions in Low-Power Back-Biased SRAM Cells. Electronics, 11(2), 203. https://doi.org/10.3390/electronics11020203