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Rajkowski T, Saigné F, Niskanen K, Boch J, Maraine T, Kohler P, Dubus P, Touboul A, Wang P-X. Comparison of the Total Ionizing Dose Sensitivity of a System in Package Point of Load Converter Using Both Component- and System-Level Test Approaches. Electronics. 2021; 10(11):1235. https://doi.org/10.3390/electronics10111235

Rajkowski, Tomasz, Frédéric Saigné, Kimmo Niskanen, Jérôme Boch, Tadec Maraine, Pierre Kohler, Patrick Dubus, Antoine Touboul, and Pierre-Xiao Wang. 2021. "Comparison of the Total Ionizing Dose Sensitivity of a System in Package Point of Load Converter Using Both Component- and System-Level Test Approaches" Electronics 10, no. 11: 1235. https://doi.org/10.3390/electronics10111235

Rajkowski, T., Saigné, F., Niskanen, K., Boch, J., Maraine, T., Kohler, P., Dubus, P., Touboul, A., & Wang, P.-X. (2021). Comparison of the Total Ionizing Dose Sensitivity of a System in Package Point of Load Converter Using Both Component- and System-Level Test Approaches. Electronics, 10(11), 1235. https://doi.org/10.3390/electronics10111235