Article Versions Notes

Secco E, Mengistu HT, Segura-Ruíz J, Martínez-Criado G, García-Cristóbal A, Cantarero A, Foltynski B, Behmenburg H, Giesen C, Heuken M, et al. Elemental Distribution and Structural Characterization of GaN/InGaN Core-Shell Single Nanowires by Hard X-ray Synchrotron Nanoprobes. Nanomaterials. 2019; 9(5):691. https://doi.org/10.3390/nano9050691

Secco, Eleonora, Heruy Taddese Mengistu, Jaime Segura-Ruíz, Gema Martínez-Criado, Alberto García-Cristóbal, Andrés Cantarero, Bartosz Foltynski, Hannes Behmenburg, Christoph Giesen, Michael Heuken, and et al. 2019. "Elemental Distribution and Structural Characterization of GaN/InGaN Core-Shell Single Nanowires by Hard X-ray Synchrotron Nanoprobes" Nanomaterials 9, no. 5: 691. https://doi.org/10.3390/nano9050691

Secco, E., Mengistu, H. T., Segura-Ruíz, J., Martínez-Criado, G., García-Cristóbal, A., Cantarero, A., Foltynski, B., Behmenburg, H., Giesen, C., Heuken, M., & Garro, N. (2019). Elemental Distribution and Structural Characterization of GaN/InGaN Core-Shell Single Nanowires by Hard X-ray Synchrotron Nanoprobes. Nanomaterials, 9(5), 691. https://doi.org/10.3390/nano9050691