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Journal: Nanomaterials, 2020
Volume: 10
Number: 1186
Article:
Channel Defect Profiling and Passivation for ZnO Thin-Film Transistors
Authors:
by
Soo Cheol Kang, So Young Kim, Sang Kyung Lee, Kiyung Kim, Billal Allouche, Hyeon Jun Hwang and Byoung Hun Lee
Link:
https://www.mdpi.com/2079-4991/10/6/1186
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