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Journal: Appl. Sci., 2018
Volume: 8
Number: 670

Article: Strained Silicon Single Nanowire Gate-All-Around TFETs with Optimized Tunneling Junctions
Authors: by Keyvan Narimani, Stefan Trellenkamp, Andreas Tiedemann, Siegfried Mantl and Qing-Tai Zhao
Link: https://www.mdpi.com/2076-3417/8/5/670

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