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Journal: Appl. Sci., 2025
Volume: 15
Number: 6238

Article: MAS-YOLO: A Lightweight Detection Algorithm for PCB Defect Detection Based on Improved YOLOv12
Authors: by Xupeng Yin, Zikai Zhao and Liguo Weng
Link: https://www.mdpi.com/2076-3417/15/11/6238

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