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Journal: Appl. Sci., 2024
Volume: 14
Number: 3623

Article: An Instance Segmentation Method for Insulator Defects Based on an Attention Mechanism and Feature Fusion Network
Authors: by Junpeng Wu, Qitong Deng, Ran Xian, Xinguang Tao and Zhi Zhou
Link: https://www.mdpi.com/2076-3417/14/9/3623

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