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Journal: Appl. Sci., 2021
Volume: 11
Number: 3451

Article: Addendum: Fang, Q.; Maldague, X. A Method of Defect Depth Estimation for Simulated Infrared Thermography Data with Deep Learning. Appl. Sci. 2020, 10, 6819
Authors: by Qiang Fang and Xavier. Maldague
Link: https://www.mdpi.com/2076-3417/11/8/3451

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