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Journal: Appl. Sci., 2021
Volume: 11
Number: 11040
Article:
Leveraging Expert Knowledge for Label Noise Mitigation in Machine Learning
Authors:
by
Quoc Nguyen, Tomoaki Shikina, Daichi Teruya, Seiji Hotta, Huy-Dung Han and Hironori Nakajo
Link:
https://www.mdpi.com/2076-3417/11/22/11040
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