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        Journal: Appl. Sci., 2021
        Volume: 11 
                	Number: 11040 
                
        
        Article:
        Leveraging Expert Knowledge for Label Noise Mitigation in Machine Learning 
        Authors: 
       	by
                    Quoc Nguyen, Tomoaki Shikina, Daichi Teruya, Seiji Hotta, Huy-Dung Han and Hironori Nakajo        
        Link:
        https://www.mdpi.com/2076-3417/11/22/11040
        
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