Order Article Reprints

Gorel A, Grünbein ML, Bean R, Bielecki J, Hilpert M, Cascella M, Colletier J-P, Fangohr H, Foucar L, Hartmann E, et al. Shock Damage Analysis in Serial Femtosecond Crystallography Data Collected at MHz X-ray Free-Electron Lasers. Crystals. 2020; 10(12):1145. https://doi.org/10.3390/cryst10121145

Gorel, Alexander, Marie Luise Grünbein, Richard Bean, Johan Bielecki, Mario Hilpert, Michele Cascella, Jacques-Philippe Colletier, Hans Fangohr, Lutz Foucar, Elisabeth Hartmann, and et al. 2020. "Shock Damage Analysis in Serial Femtosecond Crystallography Data Collected at MHz X-ray Free-Electron Lasers" Crystals 10, no. 12: 1145. https://doi.org/10.3390/cryst10121145

Gorel, A., Grünbein, M. L., Bean, R., Bielecki, J., Hilpert, M., Cascella, M., Colletier, J.-P., Fangohr, H., Foucar, L., Hartmann, E., Hunter, M. S., Kirkwood, H., Kloos, M., Letrun, R., Michelat, T., Shoeman, R. L., Sztuk-Dambietz, J., Tetreau, G., Zimmermann, H., ... Schlichting, I. (2020). Shock Damage Analysis in Serial Femtosecond Crystallography Data Collected at MHz X-ray Free-Electron Lasers. Crystals, 10(12), 1145. https://doi.org/10.3390/cryst10121145