Shock Damage Analysis in Serial Femtosecond Crystallography Data Collected at MHz X-ray Free-Electron Lasers
Gorel, A.; Grünbein, M.L.; Bean, R.; Bielecki, J.; Hilpert, M.; Cascella, M.; Colletier, J.-P.; Fangohr, H.; Foucar, L.; Hartmann, E.; Hunter, M.S.; Kirkwood, H.; Kloos, M.; Letrun, R.; Michelat, T.; Shoeman, R.L.; Sztuk-Dambietz, J.; Tetreau, G.; Zimmermann, H.; Mancuso, A.P.; Barends, T.R.M.; Doak, R.B.; Stan, C.A.; Schlichting, I. Shock Damage Analysis in Serial Femtosecond Crystallography Data Collected at MHz X-ray Free-Electron Lasers. Crystals 2020, 10, 1145. https://doi.org/10.3390/cryst10121145
Gorel A, Grünbein ML, Bean R, Bielecki J, Hilpert M, Cascella M, Colletier J-P, Fangohr H, Foucar L, Hartmann E, Hunter MS, Kirkwood H, Kloos M, Letrun R, Michelat T, Shoeman RL, Sztuk-Dambietz J, Tetreau G, Zimmermann H, Mancuso AP, Barends TRM, Doak RB, Stan CA, Schlichting I. Shock Damage Analysis in Serial Femtosecond Crystallography Data Collected at MHz X-ray Free-Electron Lasers. Crystals. 2020; 10(12):1145. https://doi.org/10.3390/cryst10121145
Chicago/Turabian StyleGorel, Alexander; Grünbein, Marie L.; Bean, Richard; Bielecki, Johan; Hilpert, Mario; Cascella, Michele; Colletier, Jacques-Philippe; Fangohr, Hans; Foucar, Lutz; Hartmann, Elisabeth; Hunter, Mark S.; Kirkwood, Henry; Kloos, Marco; Letrun, Romain; Michelat, Thomas; Shoeman, Robert L.; Sztuk-Dambietz, Jolanta; Tetreau, Guillaume; Zimmermann, Herbert; Mancuso, Adrian P.; Barends, Thomas R.M.; Doak, R. B.; Stan, Claudiu A.; Schlichting, Ilme. 2020. "Shock Damage Analysis in Serial Femtosecond Crystallography Data Collected at MHz X-ray Free-Electron Lasers" Crystals 10, no. 12: 1145. https://doi.org/10.3390/cryst10121145