Shock Damage Analysis in Serial Femtosecond Crystallography Data Collected at MHz X-ray Free-Electron Lasers
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Gorel, A.; Grünbein, M.L.; Bean, R.; Bielecki, J.; Hilpert, M.; Cascella, M.; Colletier, J.-P.; Fangohr, H.; Foucar, L.; Hartmann, E.; Hunter, M.S.; Kirkwood, H.; Kloos, M.; Letrun, R.; Michelat, T.; Shoeman, R.L.; Sztuk-Dambietz, J.; Tetreau, G.; Zimmermann, H.; Mancuso, A.P.; Barends, T.R.M.; Doak, R.B.; Stan, C.A.; Schlichting, I. Shock Damage Analysis in Serial Femtosecond Crystallography Data Collected at MHz X-ray Free-Electron Lasers. Crystals 2020, 10, 1145. https://doi.org/10.3390/cryst10121145
Gorel A, Grünbein ML, Bean R, Bielecki J, Hilpert M, Cascella M, Colletier J-P, Fangohr H, Foucar L, Hartmann E, Hunter MS, Kirkwood H, Kloos M, Letrun R, Michelat T, Shoeman RL, Sztuk-Dambietz J, Tetreau G, Zimmermann H, Mancuso AP, Barends TRM, Doak RB, Stan CA, Schlichting I. Shock Damage Analysis in Serial Femtosecond Crystallography Data Collected at MHz X-ray Free-Electron Lasers. Crystals. 2020; 10(12):1145. https://doi.org/10.3390/cryst10121145
Chicago/Turabian StyleGorel, Alexander, Marie Luise Grünbein, Richard Bean, Johan Bielecki, Mario Hilpert, Michele Cascella, Jacques-Philippe Colletier, Hans Fangohr, Lutz Foucar, Elisabeth Hartmann, Mark S. Hunter, Henry Kirkwood, Marco Kloos, Romain Letrun, Thomas Michelat, Robert L. Shoeman, Jolanta Sztuk-Dambietz, Guillaume Tetreau, Herbert Zimmermann, Adrian P. Mancuso, Thomas R.M. Barends, R. Bruce Doak, Claudiu Andrei Stan, and Ilme Schlichting. 2020. "Shock Damage Analysis in Serial Femtosecond Crystallography Data Collected at MHz X-ray Free-Electron Lasers" Crystals 10, no. 12: 1145. https://doi.org/10.3390/cryst10121145
