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Journal: Micromachines, 2025
Volume: 16
Number: 1424
1424
Article: Incorporation of Temperature Impact on Hot-Carrier Degradation into Compact Physics Model
Authors: by Stanislav Tyaginov, Erik Bury, Alexander Grill, Ethan Kao, An De Keersgieter, Alexander Makarov, Michiel Vandemaele, Alessio Spessot, Adrian Chasin and Ben Kaczer
Link: https://www.mdpi.com/2072-666X/16/12/1424

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