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Journal: Micromachines, 2025
Volume: 16
Number: 267
Article:
A Defect Detection Algorithm for Optoelectronic Detectors Utilizing GLV-YOLO
Authors:
by
Xinfang Zhao, Qinghua Lyu, Hui Zeng, Zhuoyi Ling, Zhongsheng Zhai, Hui Lyu, Saffa Riffat, Benyuan Chen and Wanting Wang
Link:
https://www.mdpi.com/2072-666X/16/3/267
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