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Journal: Micromachines, 2025
Volume: 16
Number: 267
267
Article: A Defect Detection Algorithm for Optoelectronic Detectors Utilizing GLV-YOLO
Authors: by Xinfang Zhao, Qinghua Lyu, Hui Zeng, Zhuoyi Ling, Zhongsheng Zhai, Hui Lyu, Saffa Riffat, Benyuan Chen and Wanting Wang
Link: https://www.mdpi.com/2072-666X/16/3/267

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