Shi, L.; Zhou, N.; Wu, J.; Shi, M.; Shi, Y.; Lei, C.; Mao, H.
An All-in-One Testing Chip for the Simultaneous Measurement of Multiple Thermoelectric Parameters in Doped Polysilicon. Micromachines 2025, 16, 116.
https://doi.org/10.3390/mi16020116
AMA Style
Shi L, Zhou N, Wu J, Shi M, Shi Y, Lei C, Mao H.
An All-in-One Testing Chip for the Simultaneous Measurement of Multiple Thermoelectric Parameters in Doped Polysilicon. Micromachines. 2025; 16(2):116.
https://doi.org/10.3390/mi16020116
Chicago/Turabian Style
Shi, Lei, Na Zhou, Jintao Wu, Meng Shi, Yizhi Shi, Cheng Lei, and Haiyang Mao.
2025. "An All-in-One Testing Chip for the Simultaneous Measurement of Multiple Thermoelectric Parameters in Doped Polysilicon" Micromachines 16, no. 2: 116.
https://doi.org/10.3390/mi16020116
APA Style
Shi, L., Zhou, N., Wu, J., Shi, M., Shi, Y., Lei, C., & Mao, H.
(2025). An All-in-One Testing Chip for the Simultaneous Measurement of Multiple Thermoelectric Parameters in Doped Polysilicon. Micromachines, 16(2), 116.
https://doi.org/10.3390/mi16020116
