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Journal: MicromachinesVolume: 16Number: 1424
Article: Incorporation of Temperature Impact on Hot-Carrier Degradation into Compact Physics Model
  • Authors:
  • Stanislav Tyaginov1,*,
  • Erik Bury1 and
  • Alexander Grill1
  • et al.
Link: https://www.mdpi.com/2072-666X/16/12/1424

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