- Article
Interaction of Negative Bias Instability and Self-Heating Effect on Threshold Voltage and SRAM (Static Random-Access Memory) Stability of Nanosheet Field-Effect Transistors
- Xiaoming Li,
- Yali Shao,
- Yunqi Wang,
- Fang Liu,
- Fengyu Kuang,
- Yiqi Zhuang and
- Cong Li
In this paper, we investigate the effects of negative bias instability (NBTI) and self-heating effect (SHE) on threshold voltage in NSFETs. To explore accurately the interaction between SHE and NBTI, we established an NBTI simulation framework based...

