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Journal: Micromachines, 2023
Volume: 14
Number: 2098
2098
Article: Systematical Investigation of Flicker Noise in 14 nm FinFET Devices towards Stochastic Computing Application
Authors: by Danian Dong, Jinru Lai, Yan Yang, Tiancheng Gong, Xu Zheng, Wenxuan Sun, Jie Yu, Shaoyang Fan and Xiaoxin Xu
Link: https://www.mdpi.com/2072-666X/14/11/2098

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