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Journal: Micromachines, 2022
Volume: 13
Number: 2140
Article:
Buffer Traps Effect on GaN-on-Si High-Electron-Mobility Transistor at Different Substrate Voltages
Authors:
by
Yuan Lin, Min-Lu Kao, You-Chen Weng, Chang-Fu Dee, Shih-Chen Chen, Hao-Chung Kuo, Chun-Hsiung Lin and Edward-Yi Chang
Link:
https://www.mdpi.com/2072-666X/13/12/2140
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