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Lin Y, Kao M-L, Weng Y-C, Dee C-F, Chen S-C, Kuo H-C, Lin C-H, Chang E-Y. Buffer Traps Effect on GaN-on-Si High-Electron-Mobility Transistor at Different Substrate Voltages. Micromachines. 2022; 13(12):2140. https://doi.org/10.3390/mi13122140

Lin, Yuan, Min-Lu Kao, You-Chen Weng, Chang-Fu Dee, Shih-Chen Chen, Hao-Chung Kuo, Chun-Hsiung Lin, and Edward-Yi Chang. 2022. "Buffer Traps Effect on GaN-on-Si High-Electron-Mobility Transistor at Different Substrate Voltages" Micromachines 13, no. 12: 2140. https://doi.org/10.3390/mi13122140

Lin, Y., Kao, M.-L., Weng, Y.-C., Dee, C.-F., Chen, S.-C., Kuo, H.-C., Lin, C.-H., & Chang, E.-Y. (2022). Buffer Traps Effect on GaN-on-Si High-Electron-Mobility Transistor at Different Substrate Voltages. Micromachines, 13(12), 2140. https://doi.org/10.3390/mi13122140