MDPI and ACS Style
Teodoro, P.E.; Teodoro, L.P.R.; Baio, F.H.R.; da Silva Junior, C.A.; dos Santos, R.G.; Ramos, A.P.M.; Pinheiro, M.M.F.; Osco, L.P.; Gonçalves, W.N.; Carneiro, A.M.;
et al. Predicting Days to Maturity, Plant Height, and Grain Yield in Soybean: A Machine and Deep Learning Approach Using Multispectral Data. Remote Sens. 2021, 13, 4632.
https://doi.org/10.3390/rs13224632
AMA Style
Teodoro PE, Teodoro LPR, Baio FHR, da Silva Junior CA, dos Santos RG, Ramos APM, Pinheiro MMF, Osco LP, Gonçalves WN, Carneiro AM,
et al. Predicting Days to Maturity, Plant Height, and Grain Yield in Soybean: A Machine and Deep Learning Approach Using Multispectral Data. Remote Sensing. 2021; 13(22):4632.
https://doi.org/10.3390/rs13224632
Chicago/Turabian Style
Teodoro, Paulo Eduardo, Larissa Pereira Ribeiro Teodoro, Fábio Henrique Rojo Baio, Carlos Antonio da Silva Junior, Regimar Garcia dos Santos, Ana Paula Marques Ramos, Mayara Maezano Faita Pinheiro, Lucas Prado Osco, Wesley Nunes Gonçalves, Alexsandro Monteiro Carneiro,
and et al. 2021. "Predicting Days to Maturity, Plant Height, and Grain Yield in Soybean: A Machine and Deep Learning Approach Using Multispectral Data" Remote Sensing 13, no. 22: 4632.
https://doi.org/10.3390/rs13224632
