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Volume 15
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10.3390/ma15072396
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Article

Characterization of Low-Loss Dielectric Materials for High-Speed and High-Frequency Applications

by
Tzu-Nien Lee
,
John-H Lau
*,
Cheng-Ta Ko
,
Tim Xia
,
Eagle Lin
,
Kai-Ming Yang
,
Puru-Bruce Lin
,
Chia-Yu Peng
,
Leo Chang
,
Jia-Shiang Chen
,
Yi-Hsiu Fang
,
Li-Yueh Liao
,
Edward Charn
,
Jason Wang
and
Tzyy-Jang Tseng
Unimicron Technology Corporation, No. 179, Shanying Road, Taoyuan City 33341, Taiwan
*
Author to whom correspondence should be addressed.
Materials 2022, 15(7), 2396; https://doi.org/10.3390/ma15072396
Submission received: 22 December 2021 / Revised: 9 March 2022 / Accepted: 18 March 2022 / Published: 24 March 2022
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Abstract

In this study, the Df (dissipation factor or loss tangent) and Dk (dielectric constant or permittivity) of the low-loss dielectric material from three different vendors are measured by the Fabry–Perot open resonator (FPOR) technique. Emphasis is placed on the sample preparation, data collection, and the comparison with the data sheet values provided from vendors. A coplanar waveguide with ground (CPWG) test vehicle with one of these raw dielectric materials (vendor 1) is designed (through Polar and simulation) and fabricated. The impedance of the test vehicle is measured by TDR (time-domain reflectometer), and the effective Dk of the test vehicle is calculated by the real cross-section of the metal line width, spacing, and thickness of the test vehicle and a closed-form equation. In parallel, the insertion loss and return loss are measured with the VNA (vector network analyzer) of the test vehicle. Finally, the measurement and simulation results are correlated. Some recommendations on the low-loss dielectric materials of the Dk and Df are also provided.
Keywords: dielectric materials; high-speed and high-frequency; insertion loss and return loss dielectric materials; high-speed and high-frequency; insertion loss and return loss

Share and Cite

MDPI and ACS Style

Lee, T.-N.; Lau, J.-H.; Ko, C.-T.; Xia, T.; Lin, E.; Yang, K.-M.; Lin, P.-B.; Peng, C.-Y.; Chang, L.; Chen, J.-S.; et al. Characterization of Low-Loss Dielectric Materials for High-Speed and High-Frequency Applications. Materials 2022, 15, 2396. https://doi.org/10.3390/ma15072396

AMA Style

Lee T-N, Lau J-H, Ko C-T, Xia T, Lin E, Yang K-M, Lin P-B, Peng C-Y, Chang L, Chen J-S, et al. Characterization of Low-Loss Dielectric Materials for High-Speed and High-Frequency Applications. Materials. 2022; 15(7):2396. https://doi.org/10.3390/ma15072396

Chicago/Turabian Style

Lee, Tzu-Nien, John-H Lau, Cheng-Ta Ko, Tim Xia, Eagle Lin, Kai-Ming Yang, Puru-Bruce Lin, Chia-Yu Peng, Leo Chang, Jia-Shiang Chen, and et al. 2022. "Characterization of Low-Loss Dielectric Materials for High-Speed and High-Frequency Applications" Materials 15, no. 7: 2396. https://doi.org/10.3390/ma15072396

APA Style

Lee, T.-N., Lau, J.-H., Ko, C.-T., Xia, T., Lin, E., Yang, K.-M., Lin, P.-B., Peng, C.-Y., Chang, L., Chen, J.-S., Fang, Y.-H., Liao, L.-Y., Charn, E., Wang, J., & Tseng, T.-J. (2022). Characterization of Low-Loss Dielectric Materials for High-Speed and High-Frequency Applications. Materials, 15(7), 2396. https://doi.org/10.3390/ma15072396

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