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Journal: Materials, 2022
Volume: 15
Number: 264

Article: Radiation Hardness of 4H-SiC P-N Junction UV Photo-Detector
Authors: by Antonella Sciuto, Lucia Calcagno, Salvatore Di Franco, Domenico Pellegrino, Lorenzo Maurizio Selgi and Giuseppe D’Arrigo
Link: https://www.mdpi.com/1996-1944/15/1/264

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