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Journal: Sensors, 2025
Volume: 25
Number: 1235

Article: Systematic Analysis of Driving Modes and NiFe Layer Thickness in Planar Hall Magnetoresistance Sensors
Authors: by Changyeop Jeon, Mijin Kim, Jinwoo Kim, Sunghee Yang, Eunseo Choi and Byeonghwa Lim
Link: https://www.mdpi.com/1424-8220/25/4/1235

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