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Journal: Sensors, 2023
Volume: 23
Number: 3523

Article: Machine Learning Analysis of Hyperspectral Images of Damaged Wheat Kernels
Authors: by Kshitiz Dhakal, Upasana Sivaramakrishnan, Xuemei Zhang, Kassaye Belay, Joseph Oakes, Xing Wei and Song Li
Link: https://www.mdpi.com/1424-8220/23/7/3523

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