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Journal: Sensors, 2022
Volume: 22
Number: 4205
Article:
Benchmarking Object Detection Deep Learning Models in Embedded Devices
Authors:
by
David Cantero, Iker Esnaola-Gonzalez, Jose Miguel-Alonso and Ekaitz Jauregi
Link:
https://www.mdpi.com/1424-8220/22/11/4205
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