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Journal: Sensors, 2022
Volume: 22
Number: 4205

Article: Benchmarking Object Detection Deep Learning Models in Embedded Devices
Authors: by David Cantero, Iker Esnaola-Gonzalez, Jose Miguel-Alonso and Ekaitz Jauregi
Link: https://www.mdpi.com/1424-8220/22/11/4205

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