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Journal: Sensors, 2021
Volume: 21
Number: 7566
Article:
Simulating 50 keV X-ray Photon Detection in Silicon with a Down-Conversion Layer
Authors:
by
Kaitlin M. Anagnost, Eldred Lee, Zhehui Wang, Jifeng Liu and Eric R. Fossum
Link:
https://www.mdpi.com/1424-8220/21/22/7566
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