Bannister, J.J.; Crites, S.R.; Aponte, J.D.; Katz, D.C.; Wilms, M.; Klein, O.D.; Bernier, F.P.J.; Spritz, R.A.; HallgrĂmsson, B.; Forkert, N.D.
Fully Automatic Landmarking of Syndromic 3D Facial Surface Scans Using 2D Images. Sensors 2020, 20, 3171.
https://doi.org/10.3390/s20113171
AMA Style
Bannister JJ, Crites SR, Aponte JD, Katz DC, Wilms M, Klein OD, Bernier FPJ, Spritz RA, HallgrĂmsson B, Forkert ND.
Fully Automatic Landmarking of Syndromic 3D Facial Surface Scans Using 2D Images. Sensors. 2020; 20(11):3171.
https://doi.org/10.3390/s20113171
Chicago/Turabian Style
Bannister, Jordan J., Sebastian R. Crites, J. David Aponte, David C. Katz, Matthias Wilms, Ophir D. Klein, Francois P. J. Bernier, Richard A. Spritz, Benedikt HallgrĂmsson, and Nils D. Forkert.
2020. "Fully Automatic Landmarking of Syndromic 3D Facial Surface Scans Using 2D Images" Sensors 20, no. 11: 3171.
https://doi.org/10.3390/s20113171
APA Style
Bannister, J. J., Crites, S. R., Aponte, J. D., Katz, D. C., Wilms, M., Klein, O. D., Bernier, F. P. J., Spritz, R. A., HallgrĂmsson, B., & Forkert, N. D.
(2020). Fully Automatic Landmarking of Syndromic 3D Facial Surface Scans Using 2D Images. Sensors, 20(11), 3171.
https://doi.org/10.3390/s20113171