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Journal: Sensors, 2019
Volume: 19
Number: 4529
4529
Article: Nanomechanical Characterization of Vertical Nanopillars Using an MEMS-SPM Nano-Bending Testing Platform
Authors: by Zhi Li, Sai Gao, Uwe Brand, Karla Hiller, Susann Hahn, Gerry Hamdana, Erwin Peiner, Helmut Wolff and Detlef Bergmann
Link: https://www.mdpi.com/1424-8220/19/20/4529

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