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Search Results (553)

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60 pages, 42740 KB  
Review
Coalbed Biogenic Methane: Insights on the “Blind Spots” in Mitigation of Emissions
by Romeo M. Flores
Methane 2026, 5(3), 20; https://doi.org/10.3390/methane5030020 - 2 Jul 2026
Viewed by 107
Abstract
Biogenic or microbial methane (CH4) emissions, believed to be the main driver of the recent surge in global atmospheric CH4 emissions, have altered monitoring, measurement, and mitigation of fossil-fuel emissions. As of 1981, over 20% of the world’s natural gas [...] Read more.
Biogenic or microbial methane (CH4) emissions, believed to be the main driver of the recent surge in global atmospheric CH4 emissions, have altered monitoring, measurement, and mitigation of fossil-fuel emissions. As of 1981, over 20% of the world’s natural gas reserves were biogenic in origin. Additional biogenic CH4 reserves from coal have been discovered since 1981 mixed (40–80%) with thermogenic CH4. Biogenic CH4 accumulates up to 100% in coal reservoirs in the Powder River Basin (PRB), USA. Biogenic CH4 is generated by microbial breakdown of fossil organic matter as an early-stage (primary) type during burial over geologic time and is rarely preserved. Also, biogenic CH4 is generated as a late-stage (secondary) type from recent geologic to present times and is commonly preserved. Late-stage biogenic CH4 is sustained by nutrients and microbes in meteoric/surface waters discharged into coal aquifers. Groundwater is pumped from wells in coal aquifers to desorb and produce CH4 and dewater coal mines. The co-produced water with dissolved CH4 is discharged into diverse surface aquatic systems. The emission factors (EFs) of co-produced water are 2.0522 × 10−9 Gg CH4/gal of water in the PRB and 2.0694 × 10−3 Gg CH4/well in the Black Warrior Basin, U.S. Accurate data on biogenic CH4 emissions from coal sources is a major gap in the accounting of current global groundwater-driven CH4 whose average flux is estimated to be 3.9 ± 6.2 mmol/m2/day or accounting for up to 70% of CH4 emissions from surface aquatic systems. Biogenic CH4 emissions from coal mining and coalbed gas extractions and related infrastructures are overlooked because the focus has been on coalmine methane (CMM) emissions. CMM data from ground-based measurements is highly variable and used by the Intergovernmental Panel on Climate Change three-tier system to estimate EFs for national inventories. However, 90% of CMM emissions are attributable to a small group of the most coal-consuming-and-producing countries but fails to capture other coal sources worldwide. This created gaps and “blind spots” in “unstructured” low-concentration, diffused biogenic CH4 emission data. These key “blind spots” include sources from flooded, abandoned coal mines; coalbed methane (CBM) co-produced water with dissolved CH4 and infrastructures/facilities; and groundwater drawdown from water withdrawals during coal mining and CBM extraction. Also, a critical “blind spot” is the mixing of biogenic CH4 emissions from subsurface coals with biogenic CH4 generated at the surface from wetlands, agriculture, and landfills/wastes, which grew 85% from 2008 to 2020. Limited understanding of the mixing of biogenic CH4 from diverse sources and their contributions to global methane requires accurate attribution of overlapping isotopic signatures (δ13CCH4 and δD). This paper addresses knowledge gaps in coalbed biogenic CH4 emissions by a systematic review of the literature and specific study cases, which provided insights on key “blind spots” in their mitigation. Full article
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29 pages, 17021 KB  
Article
Integrated LIBS-EPMA and Multivariate Statistical Analysis for Ge-Bearing Mineral Characterization: A Tool for High-Tech Critical Metals Exploration
by Nicolas Afanassieff, Emilie Janots, Octave Reignier, Vincent Motto-Ros, Valentina Batanova, Dennis Lahondès, Etienne Le Goff, Jérémie Melleton and Bénédicte Cenki
Minerals 2026, 16(7), 685; https://doi.org/10.3390/min16070685 - 29 Jun 2026
Viewed by 146
Abstract
Germanium (Ge) is a high-tech critical metal typically hosted at trace levels in sphalerite, making its detection and characterization challenging in both primary ores and mine residues. This study presents a multi-scale analytical workflow combining laser-induced breakdown spectroscopy (LIBS), electron probe micro-analysis (EPMA), [...] Read more.
Germanium (Ge) is a high-tech critical metal typically hosted at trace levels in sphalerite, making its detection and characterization challenging in both primary ores and mine residues. This study presents a multi-scale analytical workflow combining laser-induced breakdown spectroscopy (LIBS), electron probe micro-analysis (EPMA), and multivariate statistics to detect, map and quantify Ge distribution in a representative Pb-Zn sample from the Les Malines deposit (France). µ-LIBS mapping enables rapid centimeter-scale screening at 15 µm resolution and identifies Ge-bearing domains over large areas, which are subsequently investigated at micrometer scale using EPMA chemical mapping and quantitative analyses. Results reveal a strong µm-scale heterogeneity of Ge distribution within sphalerite, with Ge systematically concentrated in an Fe-rich intermediate zonation associated with prismatic growth textures, while Cu/Cd/Ag are enriched in distinct collomorph domains. Multivariate statistical analyses (correlation matrices and PCA) confirm a strong geochemical structuring opposing an Fe/Ge association against a Cu/Cd/Ag pole. These findings demonstrate that Ge incorporation is controlled by localized growth conditions rather than bulk composition. The proposed workflow provides an efficient and scalable framework for exploration, enabling rapid targeting of critical metal enrichments and supporting their extension to multiple mineralization stages, Pb-Zn deposits, and other high-tech critical metals (HTCMs) such as Ga and In. Full article
23 pages, 18171 KB  
Article
Electrode Erosion and Prefire Studies Towards Fusion Scale Pulsed Power
by Luke Boswell, Raimi Clark, Jacob Stephens, John Mankowski, James Dickens, Adam Steiner, Max Flynn and Andreas Neuber
Energies 2026, 19(13), 3043; https://doi.org/10.3390/en19133043 - 27 Jun 2026
Viewed by 226
Abstract
This study presents a comprehensive investigation of electrode erosion and discharge behavior in spark gap switches over long switching cycle lifetimes. Brass, copper–tungsten (CuW), and stainless steel electrodes are tested under controlled conditions to quantify material degradation, debris accumulation, and changes in breakdown [...] Read more.
This study presents a comprehensive investigation of electrode erosion and discharge behavior in spark gap switches over long switching cycle lifetimes. Brass, copper–tungsten (CuW), and stainless steel electrodes are tested under controlled conditions to quantify material degradation, debris accumulation, and changes in breakdown voltage. High-resolution imaging and statistical analysis of spark channel locations and gap breakdown voltages reveal how surface evolution influences long-term performance and reliability. These results provide essential data for lifetime modeling and inform design strategies for pulsed power systems in emerging applications such as private sector fusion energy and large-scale facilities like Sandia’s Z Machine and proposed ZX upgrades, where high repetition reliability and predictable behavior are critical. Full article
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15 pages, 2929 KB  
Article
Electrical Breakdown Characteristics of LNG for Cryogenic Feedthrough Insulation Under Explosion-Proof Conditions
by Byung-Bae Park, Ik-Su Kwon, Jeon-Wook Cho and Bang-Wook Lee
Energies 2026, 19(12), 2945; https://doi.org/10.3390/en19122945 - 22 Jun 2026
Viewed by 166
Abstract
Reliable insulation design for LNG feedthroughs requires fundamental dielectric breakdown data obtained under cryogenic LNG conditions. However, such data remain scarce owing to the explosion-proof requirements imposed by the flammable nature of LNG. Furthermore, the influence of phase differences between LNG and NG [...] Read more.
Reliable insulation design for LNG feedthroughs requires fundamental dielectric breakdown data obtained under cryogenic LNG conditions. However, such data remain scarce owing to the explosion-proof requirements imposed by the flammable nature of LNG. Furthermore, the influence of phase differences between LNG and NG on creepage dielectric breakdown behavior along insulation surfaces has received little attention. In this study, an explosion-proof cryostat and test facility compliant with the IEC 60079 series of standards were developed, and dielectric breakdown tests were conducted over a range of electrode gap distances and pressures. Two electrode configurations were employed: rod–plate electrodes for dielectric breakdown characterization in LN2 and LNG, and creepage electrodes for surface dielectric breakdown evaluation in NG and LNG. Experimental results show that LNG requires approximately 1–2 bar of additional operating pressure above that of LN2 to achieve equivalent dielectric strength. Moreover, LNG exhibited higher creepage dielectric breakdown voltages than NG under all test conditions, with the difference becoming more pronounced as pressure and creepage distance increased. Post-breakdown surface analysis revealed distinct differences in carbonization patterns between the two media. The findings of this study are expected to serve as fundamental reference data for the insulation design of LNG-based cryogenic feedthroughs. Full article
(This article belongs to the Section F: Electrical Engineering)
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93 pages, 2631 KB  
Review
Non-Thermal Plasma-Ozonation in Water Treatment—Synergistic Effect and Reactor Systems for Organic Micropollutant Removal (Phenolics, Pesticides and Dyes): A Review
by Paul Kaweesa, Michael O. Daramola and Samuel A. Iwarere
Processes 2026, 14(12), 1997; https://doi.org/10.3390/pr14121997 - 19 Jun 2026
Viewed by 240
Abstract
Many sectors that sustain humanity’s daily life and wellbeing contribute to the occurrence and accumulation of organic micropollutants (OMPs) in the environment, making them a global concern. This manuscript presents an appraisal of existing scientific literature on removal of OMPs from water by [...] Read more.
Many sectors that sustain humanity’s daily life and wellbeing contribute to the occurrence and accumulation of organic micropollutants (OMPs) in the environment, making them a global concern. This manuscript presents an appraisal of existing scientific literature on removal of OMPs from water by non-thermal plasma-ozonation (NTPO) synergy with specific attention on phenolics, pesticides and herbicides and organic dyes. An overview of non-thermal plasma (NTP) degrading agents in gas and aqueous phases has been given, complemented with diagnostic systems and reactive species detection methods. A scrutiny of reactor systems and their influencing operating parameters has also been discussed. For the analysed types of OMPs, the kinetics, reaction mechanisms and the synergistic degradation effects have been explored. Several studies showed NTPO and NTP/other process synergy resulting in higher degradation efficiency than the individual processes. Most removal reactions followed pseudo-first-order and second-order kinetics while the mechanistic breakdown mainly involved the action of the nonselective OH radical. This scientific critique brings to light utilisable data, provides novel insights on NTPO of OMPs, unveils science gaps for further investigation and presents a wide spectrum of points to consider in plasma water research on OMPs. Full article
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11 pages, 1890 KB  
Proceeding Paper
The Effect of Dissolved Gasses on the Insulating Properties of Natural Ester and Mineral Insulating Oils
by Thandokuhle Mathonsi, Bandile Hlatshwayo, Salman Minhas and Chandima Gomes
Eng. Proc. 2026, 140(1), 69; https://doi.org/10.3390/engproc2026140069 - 16 Jun 2026
Viewed by 157
Abstract
This paper presents an investigation into the effect of dissolved gases (DGs) on the insulating properties, such as breakdown strength, of Midel EN 1204 natural ester oil and Poweroil TO 1020 60U mineral oils. The gasses were generated by simulating thermal fault/s at [...] Read more.
This paper presents an investigation into the effect of dissolved gases (DGs) on the insulating properties, such as breakdown strength, of Midel EN 1204 natural ester oil and Poweroil TO 1020 60U mineral oils. The gasses were generated by simulating thermal fault/s at 130 °C, 210 °C, 340 °C, 400 °C, and 450 °C. Dissolved gas analysis (DGA) was conducted according to IEC 60567 to determine the concentrations of H2, CH4, C2H6, C2H4, C2H2, and CO in each of the twelve oil samples. Moisture was measured using the Karl Fischer Method according to IEC 60814. The breakdown voltage (BDV) was measured according to IEC 60156. The results show that total dissolved gas concentration and rate of rise increased with fault temperature in both oils. For this relatively short time experiment, the rise in concentration of DGs had minimal effect. The overall BDV 73.7 kV (virgin ester oil BDV) increased to 76.3 kV at 450 °C for natural ester oil, whereas the BDV of mineral oil decreased from 68.7 kV to 63.1 kV. These findings showed that natural ester oil has better insulation stability under thermal stress. Full article
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21 pages, 3641 KB  
Article
Design and Simulation of a High-Performance GaN Vertical Merged P-i-N/Schottky (MPS) Diode with Multi-Drift-Layer and Field-Plate Termination
by Yun Seop Yu, Saebin Yoon and Jong Hyeok Oh
Micromachines 2026, 17(6), 722; https://doi.org/10.3390/mi17060722 - 14 Jun 2026
Viewed by 305
Abstract
This paper presents the design, structural optimization, and two-dimensional (2D) technology computer-aided design (TCAD) simulation of a gallium nitride (GaN) vertical Merged P-i-N/Schottky (MPS) diode incorporating a multi-drift-layer doping profile, composite SiO2/Si3N4 passivation, and field-plate (FP) termination. The [...] Read more.
This paper presents the design, structural optimization, and two-dimensional (2D) technology computer-aided design (TCAD) simulation of a gallium nitride (GaN) vertical Merged P-i-N/Schottky (MPS) diode incorporating a multi-drift-layer doping profile, composite SiO2/Si3N4 passivation, and field-plate (FP) termination. The proposed device is constructed on an n+-GaN substrate with a three-sub-layer n-type drift region and a p-GaN/p+-GaN anode region. Systematic TCAD simulations are performed to investigate the dependences of key performance metrics—including knee voltage (Vknee), specific on-resistance (Ron), breakdown voltage (BV), reverse leakage current (Jleak), and Baliga’s figure of merit (BFOM)—on the Schottky metal work function, multi-drift-layer doping concentration, drift-layer thickness, Schottky-to-PN contact length ratio (γw), operating temperature, and reverse recovery switching transients. Results demonstrate that the MPS architecture effectively decouples forward conduction loss from reverse blocking capability, overcoming the conventional RonBV trade-off. The optimal doping profile (nmm = 2 × 1015, nm = 2 × 1015, n = 1 × 1016 cm−3) achieves a BFOM of ~31.97 GW·cm−2 with BV ≈ 5.98 kV and Ron ≈ 1.12 mΩ·cm2. Joint doping–thickness optimization further identifies a graded doping profile (nmm = 2 × 1015, nm = 5 × 1015, n = 1 × 1016 cm−3) combined with layer thicknesses (Tnmm, Tnm, Tn) = (4.49, 5, 20) μm as the overall optimum, achieving BFOM = 55.36 GW·cm−2 (BV = 6.61 kV, Ron = 0.79 mΩ·cm2)—a +73% improvement, governed by the punch-through/field-stop design principle. The optimal contact ratio of γw = 1.33 yields a BFOM of 38.71 GW·cm−2. Temperature analysis confirms a positive BV temperature coefficient due to drift-region-limited avalanche breakdown, and the BFOM improves monotonically from 33.31 to 37.82 GW·cm−2 between 200 K and 450 K. Mixed-mode switching simulations show that increasing γw substantially reduces reverse recovery charge (Qrr), demonstrating the strong potential of the proposed MPS diode for high-voltage, high-frequency, and high-temperature power electronic applications. Full article
(This article belongs to the Topic Wide Bandgap Semiconductor Electronics and Devices)
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19 pages, 15712 KB  
Article
Decoupling and Optimization of Intrinsic Vertical Breakdown in 8-Inch GaN-on-Si HEMT Buffer
by Wei Dong, Shuhan Zhang, Qian Fan, Xianfeng Ni and Xing Gu
Electronics 2026, 15(11), 2423; https://doi.org/10.3390/electronics15112423 - 2 Jun 2026
Viewed by 235
Abstract
This study systematically investigates the intrinsic vertical breakdown characteristics of 8-inch GaN-on-Si high-electron-mobility transistor (HEMT) buffer layers (extending up to the GaN channel layer) using a vertical electrode configuration. By comparing samples with different carbon doping doses, AlN insertion layers, and superlattice cycle [...] Read more.
This study systematically investigates the intrinsic vertical breakdown characteristics of 8-inch GaN-on-Si high-electron-mobility transistor (HEMT) buffer layers (extending up to the GaN channel layer) using a vertical electrode configuration. By comparing samples with different carbon doping doses, AlN insertion layers, and superlattice cycle numbers (buffer layer thickness), combined with Technology Computer-Aided Design (TCAD) simulations, the relevant mechanisms are revealed. The results show that buffer layer thickness is a critical factor determining the vertical breakdown voltage. Its increase effectively reduces the longitudinal average electric field, widens the depletion region, and increases the breakdown voltage by approximately 50%. Carbon doping compensates for carriers and suppresses leakage through deep-level acceptor traps. Inserting thin AlN layers into the superlattice has a limited effect on improving breakdown voltage. This research provides clear experimental guidance for the optimal design of high-voltage GaN HEMT buffer layers from both material and physical perspectives. Full article
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11 pages, 2011 KB  
Article
High Breakdown Voltage (>3 kV) in β-Ga2O3 Lateral MOSFETs Enabled by a Si3N4 Terminal Structure
by Hengrui Zhang, Ningtao Liu, Zefeng Wang, Zhihao Yan, Chang Liu, Shujun Zhu, Xingji Li, Weiguang Yang, Jichun Ye and Wenrui Zhang
Electronics 2026, 15(11), 2337; https://doi.org/10.3390/electronics15112337 - 28 May 2026
Viewed by 374
Abstract
We report a lateral β-Ga2O3 MOSFET incorporating a simple Si3N4 terminal structure for electric-field management. The main contribution of this work is the demonstration that this process-compatible terminal design can enhance the breakdown performance while preserving [...] Read more.
We report a lateral β-Ga2O3 MOSFET incorporating a simple Si3N4 terminal structure for electric-field management. The main contribution of this work is the demonstration that this process-compatible terminal design can enhance the breakdown performance while preserving the forward conduction characteristics of the device. The epitaxial layer exhibits high crystalline quality, a smooth surface morphology, and favorable carrier transport properties. With the Si3N4 terminal structure, the device achieves a breakdown voltage exceeding 3 kV, and the average breakdown field is increased from 0.85 MV/cm to 1.63 MV/cm. Meanwhile, the forward conduction characteristics are well maintained. Electric-field simulations further reveal that the Si3N4 terminal structure effectively mitigates electric-field crowding at the gate edge, accounting for the improved breakdown behavior. These results demonstrate that the Si3N4-based terminal design provides a simple and effective strategy for simultaneously improving breakdown performance and maintaining forward conduction characteristics in lateral β-Ga2O3 MOSFETs. Full article
(This article belongs to the Special Issue Feature Papers in Semiconductor Devices, 2nd Edition)
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20 pages, 4219 KB  
Article
Analysis of the Spatiotemporal Digestion Characteristics of Pine Pollen Processed by Different Methods in Middle-Aged Adults Using an In Vitro Digestion Model System
by Kexin Yu, Danyang Liang, Xinlei Yang, Xixian Lv, Yin Yin, Yuqin Wang, Minjie Gao, Zhitao Li and Yan Yan
Foods 2026, 15(11), 1887; https://doi.org/10.3390/foods15111887 - 27 May 2026
Viewed by 287
Abstract
This study utilized a proprietary dynamic biomimetic digestion reactor to compare the differential behaviors of broken-wall pine pollen (PB), whole-wall pine pollen (WPB), and pine pollen wall extract (T) during simulated gastrointestinal digestion and colonic fermentation in middle-aged individuals. Morphological changes were observed [...] Read more.
This study utilized a proprietary dynamic biomimetic digestion reactor to compare the differential behaviors of broken-wall pine pollen (PB), whole-wall pine pollen (WPB), and pine pollen wall extract (T) during simulated gastrointestinal digestion and colonic fermentation in middle-aged individuals. Morphological changes were observed using scanning electron microscopy, and glucose release, enzyme activity, intestinal gas composition, and gut microbiota structure were dynamically monitored. The results indicate that cell wall disruption significantly accelerated structural breakdown, resulting in the highest glucose release, superoxide dismutase, and lipase activities during the gastric and small intestinal phases, as well as the highest activity of alkaline phosphatase and H2 and CO2 gases during colonic fermentation. Due to its intact outer wall, WPB exhibited more robust and sustained enzyme activity and gas production, which was particularly beneficial for maintaining catalase activity in the descending colon of women. The T group demonstrated exceptional glucose and flavonoid release during digestion, but exhibited low SOD activity in the colon and a specific increase in H2S and VOCs in the descending colon. Furthermore, all three groups inhibited Escherichia-Shigella, with gender differences observed in the regulatory patterns. This study elucidates the processing-driven differential regulatory characteristics of pine pollen on in vitro intestinal fermentation behaviors, providing an in vitro experimental basis for the development of differentiated pine pollen products tailored to the needs of different populations. Full article
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13 pages, 2334 KB  
Article
Characteristics of Gallium Nitride-Based Dual-Gate Metal-Oxide-Semiconductor High-Electron-Mobility Transistors with Gate Oxide Layers Directly Grown by Photoelectrochemical Oxidation Method
by Zih-Siang Hung, Hsin-Ying Lee, Ricky W. Chuang and Ching-Ting Lee
Micromachines 2026, 17(6), 645; https://doi.org/10.3390/mi17060645 - 24 May 2026
Viewed by 806
Abstract
To minimize the influence of interface states and surface damage, by inserting a gate oxide layer, the photoelectrochemical oxidation method was utilized to directly grow the gate oxide layer while simultaneously creating the gate-recessed regions onto gallium nitride (GaN)-based single-gate and dual-gate metal-oxide-semiconductor [...] Read more.
To minimize the influence of interface states and surface damage, by inserting a gate oxide layer, the photoelectrochemical oxidation method was utilized to directly grow the gate oxide layer while simultaneously creating the gate-recessed regions onto gallium nitride (GaN)-based single-gate and dual-gate metal-oxide-semiconductor high-electron-mobility transistors (MOS-HEMTs). Compared to the single-gate structure, the two-dimensional electron gas (2DEG) channel layer was also modulated by the auxiliary gate, in addition to being modulated by the main gate. Consequently, a wider transconductance range, larger saturation drain-source current, lower gate leakage current, and higher drain-source breakdown voltage were the benefits derived from the auxiliary gate functionality in the dual-gate devices. Moreover, the low-frequency noise characteristics of the GaN-based MOS-HEMTs could also be improved by the dual-gate structure. These experimental results demonstrated that incorporating a dual-gate structure and directly grown gate oxide layers onto GaN-based MOS-HEMTs is a promising alternative for GaN-based low-noise, high-power, and high-frequency applications. Full article
(This article belongs to the Special Issue III–V Compound Semiconductors and Devices, 2nd Edition)
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21 pages, 2788 KB  
Review
Review of the Gate Structure for Normally Off p-GaN High-Electron-Mobility Transistors Towards High Performances
by Taofei Pu, Xiaobo Li, Liuan Li and Jin-Ping Ao
Materials 2026, 19(11), 2205; https://doi.org/10.3390/ma19112205 - 23 May 2026
Viewed by 529
Abstract
As a representative wide-bandgap semiconductor material, gallium nitride (GaN) has attracted increasing attention because of its superior material properties (e.g., high electron mobility, high electron saturation velocity, and critical electric field). For power electronics applications, and to take full advantage of the superiorities [...] Read more.
As a representative wide-bandgap semiconductor material, gallium nitride (GaN) has attracted increasing attention because of its superior material properties (e.g., high electron mobility, high electron saturation velocity, and critical electric field). For power electronics applications, and to take full advantage of the superiorities of the GaN material, the normally off operation is required based on an AlGaN/GaN heterostructure. For a commercial approach, GaN HEMTs with a p-GaN gate have become a research hotspot. The characteristics of p-GaN gate HEMTs have a significant relationship with gate structure, especially the contact type on the p-GaN layer. In this review, the necessity of normally off operation and the advantages of adopting a p-GaN gate are elaborated, followed by the theory of achieving normally off operation by p-GaN and critical fabrication processes. The various gate structures are discussed, including metal gate, junction gate and hybrid gate structures on the p-GaN layer, to improve threshold voltage. Meanwhile, the methods required to optimize breakdown voltage and monolithically integrated technologies are also demonstrated. This review outlines the development and future trends of p-GaN gate HEMTs for power systems. Full article
(This article belongs to the Special Issue Advanced Composite Materials for Next-Generation Electronic Devices)
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54 pages, 8300 KB  
Review
Comprehensive Review of Hard Ceramic Coatings for Aerospace Alloys: Fabrication, Characterization and Future Perspectives
by Abdul Qadir and Ramzan Asmatulu
J. Manuf. Mater. Process. 2026, 10(5), 179; https://doi.org/10.3390/jmmp10050179 - 19 May 2026
Viewed by 512
Abstract
Hard ceramic coatings are essential for extending the performance of metal parts under the extreme heat and stress found in aerospace and defense environments. There is a major knowledge gap regarding this topic in the current literature. While there has been significant research [...] Read more.
Hard ceramic coatings are essential for extending the performance of metal parts under the extreme heat and stress found in aerospace and defense environments. There is a major knowledge gap regarding this topic in the current literature. While there has been significant research on individual fabrication methods or specific coating materials separately, no previous review has combined experimental lifecycle data with a broad computational design approach that covers the entire design-to-deployment process. This review fills that gap by offering a unified roadmap from integrated computational materials engineering (ICME) to machine learning (ML). This roadmap speeds up the rational design of coatings for next-generation aerospace systems. The practical importance of this framework is its clear use in gas turbine engine qualification, hypersonic vehicle thermal protection, and landing gear surface engineering. It can cut down on experimental trial-and-error cycles by allowing ML-guided composition screening and condition-based maintenance through digital twin integration. The main ceramic material systems, tungsten carbide (WC), boron nitride (BN), boron carbide (B4C), silicon carbide (SiC), alumina (Al2O3), and zirconia (ZrO2), are examined for their protective roles in aerospace-grade alloys. A key contribution is the multiscale computational framework that includes density functional theory, molecular dynamics, finite element analysis, and ML-driven inverse design. Together, these methods improve predictions for thermal breakdown, multi-axial stress responses, and coating lifetime. Future research should focus on ultra-high-temperature ceramics, multifunctional self-healing coatings, and surface engineering methods driven by data. Full article
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12 pages, 2315 KB  
Article
Simulation Study of Enhancement-Mode β-Ga2O3 MOSFETs on a Novel P-Ga2O3/AlN/SiC Substrate
by Wenhai Lu, Chunyu Zhou, Danying Wang, Yong Liu, Peiyi Wang and Guanyu Wang
Micromachines 2026, 17(5), 595; https://doi.org/10.3390/mi17050595 - 13 May 2026
Viewed by 565
Abstract
This work presents the design of a β-Ga2O3 MOSFET incorporating a P-type Ga2O3 buffer layer on a high-thermal-conductivity AlN/SiC composite substrate. The electrical characteristics of the device were simulated using Sentaurus TCAD. Results demonstrate that the [...] Read more.
This work presents the design of a β-Ga2O3 MOSFET incorporating a P-type Ga2O3 buffer layer on a high-thermal-conductivity AlN/SiC composite substrate. The electrical characteristics of the device were simulated using Sentaurus TCAD. Results demonstrate that the integration of the composite substrate effectively mitigates self-heating effects, reducing the peak temperature (Tmax) from 776.5 K to 570.9 K at 300 K, while simultaneously increasing the threshold voltage (Vth) from −0.35 V to 1.52 V. Through systematic optimization of the P-Ga2O3 buffer layer thickness and doping concentration, the device achieves a breakdown voltage (Vbr) of 4781 V, a power figure of merit (PFOM) of 2.18 GW/cm2, an IDS, on/off ratio of 9.20 × 109, and cut-off/maximum oscillation frequencies (ft/fmax) of 1.29 GHz and 1.40 GHz, respectively. These findings provide a theoretical foundation for developing β-Ga2O3-based power devices with high breakdown voltage, improved thermal conductivity, and low specific on-resistance (Ron,sp). Full article
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19 pages, 8216 KB  
Article
1 μm C-Doped GaN Thin Buffer on Sapphire with >3 kV Lateral Breakdown Voltage Grown by MOCVD
by Yitian Zhang, Xianfeng Ni, Qian Fan and Xing Gu
Coatings 2026, 16(5), 594; https://doi.org/10.3390/coatings16050594 - 13 May 2026
Viewed by 723
Abstract
Sapphire-based GaN buffers face inherent challenges from the lattice mismatch between GaN and sapphire, which leads to high threading dislocation density and limits lateral breakdown voltage. In this work, we investigated the optimization of metal–organic chemical vapor deposition (MOCVD) growth parameters—specifically carbon doping [...] Read more.
Sapphire-based GaN buffers face inherent challenges from the lattice mismatch between GaN and sapphire, which leads to high threading dislocation density and limits lateral breakdown voltage. In this work, we investigated the optimization of metal–organic chemical vapor deposition (MOCVD) growth parameters—specifically carbon doping concentration, GaN buffer thickness, AlN nucleation layer thickness, growth pressure and V/III ratio—to enhance crystal quality and breakdown performance. A sapphire-based C-doped GaN buffer layer was successfully fabricated exhibiting a lateral breakdown voltage exceeding 3000 V across a 30 μm electrode gap corresponding to an average breakdown electric field of approximately 1.0 MV/cm, accompanied by low threading dislocation density, excellent surface roughness and low leakage currents. This study provides technical insights and practical growth guidelines for high-voltage sapphire-based GaN buffer layers, establishing the material basis for future high-voltage power device applications. Full article
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