- Article
Charge Trapping Effects on n−MOSFET Current Mirrors Under TID Radiation
- Dorsaf Aguir,
- Sedki Amor,
- Laurent A. Francis and
- Mohsen Machhout
This study aims to evaluate the effects of total ionizing dose (TID) radiation on the performance of n−MOSFET current mirrors. We propose an ovel experimental approach to analyze the interaction between charge trapping in the MOSFET gate o...