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Microwave Sensing and Imaging

This special issue belongs to the section “Physical Sensors“.

Special Issue Information

In the last years, microwave sensing and imaging have acquired an ever-growing importance in several applicative fields, such as non-destructive evaluation in industry and civil engineering, subsurface prospection, security, and biomedical imaging.

In principle, microwave techniques can be used to retrieve information about some physical parameters of the inspected targets (e.g., dielectric properties, shape, etc.) by using safe electromagnetic radiations and cost-effective systems, since the frequency band of interest is the same as in several other commercial apparatuses. Despite the great technological advances attained in the last years in this field, there are still some topics that could be addressed to further improve imaging systems. First, even more efficient and reliable measurement systems need to be designed and validated on a case-by-case basis, especially in realistic scenarios. Second, great attention should be paid to the development of effective data processing algorithms, able to solve the underlying electromagnetic inverse scattering problem (which is generally nonlinear and ill-posed) in order to retrieve the required information about the inspected targets from the measured scattered-field samples. Finally, efficient forward solvers are also fundamental for modeling the electromagnetic interactions between the interrogating fields and the targets in a suitable way.

In such a framework, this Special Issue aims at providing some insights into recent microwave sensing and imaging systems and techniques. Topics of interest include, but are not limited to: computational methods for electromagnetic imaging and inverse scattering, analytical and numerical forward modeling techniques in complex scenarios, sensors and antenna design, as well as innovative applications of microwave sensing and imaging.

Prof. Andrea Randazzo
Dr. Cristina Ponti
Dr. Alessandro Fedeli
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 250 words) can be sent to the Editorial Office for assessment.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Sensors is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • Microwave imaging 
  • Electromagnetic scattering 
  • Inverse scattering 
  • Inverse problems 
  • Electromagnetic modelling and simulation
  • Microwave sensors

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Sensors - ISSN 1424-8220