sensors-logo

Journal Browser

Journal Browser

Special Issue "Microwave Sensing and Imaging"

A special issue of Sensors (ISSN 1424-8220). This special issue belongs to the section "Physical Sensors".

Deadline for manuscript submissions: 31 March 2020.

Special Issue Editors

Prof. Dr. Andrea Randazzo
E-Mail Website
Guest Editor
Department of Electrical, Electronic, Telecommunications Engineering, and Naval Architecture, University of Genoa, Via all'Opera Pia 11A, I-16145 Genoa, Italy
Interests: Microwave imaging; Inverse scattering techniques; Numerical methods for electromagnetic scattering and propagation; Smart antennas
Dr. Cristina Ponti
E-Mail Website
Guest Editor
Department of Engineering, “Roma Tre” University, Italy
Interests: electromagnetic scattering, electromagnetic propagation, inverse scattering, antennas
Dr. Alessandro Fedeli
E-Mail Website
Guest Editor
Department of Electrical, Electronic, Telecommunications Engineering, and Naval Architecture, University of Genoa, 16145 Genoa, Italy
Interests: forward and inverse electromagnetic scattering; computational electromagnetics; microwave imaging
Special Issues and Collections in MDPI journals

Special Issue Information

In the last years, microwave sensing and imaging have acquired an ever-growing importance in several applicative fields, such as non-destructive evaluation in industry and civil engineering, subsurface prospection, security, and biomedical imaging.

In principle, microwave techniques can be used to retrieve information about some physical parameters of the inspected targets (e.g., dielectric properties, shape, etc.) by using safe electromagnetic radiations and cost-effective systems, since the frequency band of interest is the same as in several other commercial apparatuses. Despite the great technological advances attained in the last years in this field, there are still some topics that could be addressed to further improve imaging systems. First, even more efficient and reliable measurement systems need to be designed and validated on a case-by-case basis, especially in realistic scenarios. Second, great attention should be paid to the development of effective data processing algorithms, able to solve the underlying electromagnetic inverse scattering problem (which is generally nonlinear and ill-posed) in order to retrieve the required information about the inspected targets from the measured scattered-field samples. Finally, efficient forward solvers are also fundamental for modeling the electromagnetic interactions between the interrogating fields and the targets in a suitable way.

In such a framework, this Special Issue aims at providing some insights into recent microwave sensing and imaging systems and techniques. Topics of interest include, but are not limited to: computational methods for electromagnetic imaging and inverse scattering, analytical and numerical forward modeling techniques in complex scenarios, sensors and antenna design, as well as innovative applications of microwave sensing and imaging.

Prof. Andrea Randazzo
Dr. Cristina Ponti
Dr. Alessandro Fedeli
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All papers will be peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Sensors is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2000 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • Microwave imaging 
  • Electromagnetic scattering 
  • Inverse scattering 
  • Inverse problems 
  • Electromagnetic modelling and simulation
  • Microwave sensors

Published Papers (2 papers)

Order results
Result details
Select all
Export citation of selected articles as:

Research

Open AccessArticle
An Imaging Plane Calibration Method for MIMO Radar Imaging
Sensors 2019, 19(23), 5261; https://doi.org/10.3390/s19235261 - 29 Nov 2019
Abstract
In two dimensional cross-range multiple-input multiple-output radar imaging for aerial targets, due to the non-cooperative movement of the targets, the estimated imaging plane parameters, namely the center and the posture angles of the imaging plane, may have deviations from true values, which defocus [...] Read more.
In two dimensional cross-range multiple-input multiple-output radar imaging for aerial targets, due to the non-cooperative movement of the targets, the estimated imaging plane parameters, namely the center and the posture angles of the imaging plane, may have deviations from true values, which defocus the final image. This problem is called imaging plane mismatch in this paper. Focusing on this problem, firstly the deviations of spatial spectrum fulfilling region caused by imaging plane mismatch is analyzed, as well as the errors of the corresponding spatial spectral values. Thereupon, the calibration operation is deduced when the imaging plane parameters are accurately obtained. Afterwards, an imaging plane calibration algorithm is proposed to utilize particle swarm optimization to search out the imaging plane parameters. Finally, it is demonstrated through simulations that the proposed algorithm can accurately estimate the imaging plane parameters and achieve good image focusing performance. Full article
(This article belongs to the Special Issue Microwave Sensing and Imaging)
Show Figures

Figure 1

Open AccessArticle
Detecting Axial Ratio of Microwave Field with High Resolution Using NV Centers in Diamond
Sensors 2019, 19(10), 2347; https://doi.org/10.3390/s19102347 - 21 May 2019
Abstract
Polarization property characterization of the microwave (MW) field with high speed and resolution is vitally beneficial as the circularly-polarized MW field plays an important role in the development of quantum technologies and satellite communication technologies. In this work, we propose a scheme to [...] Read more.
Polarization property characterization of the microwave (MW) field with high speed and resolution is vitally beneficial as the circularly-polarized MW field plays an important role in the development of quantum technologies and satellite communication technologies. In this work, we propose a scheme to detect the axial ratio of the MW field with optical diffraction limit resolution with a nitrogen vacancy (NV) center in diamond. Firstly, the idea of polarization selective detection of the MW magnetic field is carried out using a single NV center implanted in a type-IIa CVD diamond with a confocal microscope system achieving a sensitivity of 1.7 μT/Hz. Then, high speed wide-field characterization of the MW magnetic field at the submillimeter scale is realized by combining wide-field microscopy and ensemble NV centers inherent in a general CVD diamond. The precision axial ratio can be detected by measuring the magnitudes of two counter-rotating circularly-polarized MW magnetic fields. The wide-field detection of the axial ratio and strength parameters of microwave fields enables high speed testing of small-scale microwave devices. Full article
(This article belongs to the Special Issue Microwave Sensing and Imaging)
Show Figures

Figure 1

Back to TopTop