Advancements and New Trends in Inverse Scattering and Imaging

Dear Colleagues,

Inverse scattering and imaging are fundamental topics in applied mathematics, physics, and engineering, with wide-ranging applications in fields such as medical imaging, geophysics, remote sensing, and nondestructive testing. The challenge of reconstructing the properties of an object or medium from scattered-wave measurements continues to drive significant theoretical and computational advancements. Despite decades of research, inverse scattering problems remain complex due to their inherently ill-posed nature, and due to the need for efficient regularization techniques, numerical solvers, and data-driven approaches.

This Special Issue aims to provide a platform for cutting-edge research on inverse scattering and imaging, fostering the development of novel analytical, numerical, and experimental methods. We seek contributions that align with the journal's scope, emphasizing both fundamental theoretical advancements and practical applications. Topics of interest include forward and inverse modeling techniques, optimization-based and data-driven methods, and hybrid approaches integrating physics-based models with artificial intelligence.

Topics of interest include, but are not limited to, the following:

• Analytical and numerical methods for inverse scattering problems;
• Regularization techniques and uniqueness results;
• Computational approaches, including machine learning for inverse problems;
• Applications in medical imaging (e.g., ultrasound, MRI, optical tomography);
• Electromagnetic and acoustic wave-based imaging methods;
• Seismic imaging and geophysical exploration;
• Non-destructive testing and material characterization;
• Near-field and far-field inverse problems;
• Multi-frequency and multi-static inversion techniques;
• Super-resolution and compressed sensing in inverse imaging;
• Experimental validation and real-world applications.

We invite original research articles and review papers addressing these topics. Contributions that explore new theoretical insights, innovative computational methods, and experimental validations are particularly welcome.

We look forward to receiving your contributions.

Prof. Dr. Raffaele Solimene
Prof. Dr. Andrea Randazzo
Dr. Alessandro Fedeli
Dr. Antonio Cuccaro
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Electronics is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

• inverse scattering
• imaging algorithms
• regularization techniques
• computational inverse problems
• electromagnetic and acoustic imaging
• machine learning for inverse problems
• wave-based tomography
• super-resolution imaging
• non-destructive testing
• geophysical and medical imaging