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Sensing, Computing and Imaging in 3D Microscopy
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Sensing, Computing and Imaging in 3D Microscopy

A special issue of Sensors (ISSN 1424-8220). This special issue belongs to the section "Sensing and Imaging".

Deadline for manuscript submissions: closed (31 March 2022) | Viewed by 19334

Special Issue Editor

Dr. Emilio Sánchez-Ortiga

E-Mail Website
Guest Editor
Faculty of Physics, University of Valencia, Valencia, Spain
Interests: microscopy; 3D imaging; digital holography; image processing

Special Issue Information

Dear Colleagues,

In recent years, the development of microscopy methods that exploit the use of non-conventional sensing and the power of image processing has provided a wide range of new applications in different fields, such as biomedical research, materials science, microfluidics, etc. This Special Issue is devoted to providing a general view of recent advances in 3D microscopy, highlighting methods that provide additional information about microscopic samples through non-conventional sensing approaches. For instance, superresolution techniques retrieve high-resolution information of specimens that is not attainable in a conventional microscope. Other techniques such as quantitative phase imaging or Brillouin microscopy measure the morphological properties of microscopic samples by means of conventional intensity sensors. Light-field microscopy and Fourier ptychography are based on multiplexing the spatio-angular information of the sample in the sensor plane. These techniques, among others, combine conventional optics with unique sensing and computing approaches, leading to novel paths to inspect and characterize samples.

The contributions to this Issue can be original research articles or reviews regarding the state-of-the-art of an already existing technique.

Topics may include but are not limited to:

- Quantitative-phase imaging microscopy;

- Brillouin microscopy;

- Light-field microscopy;

- Fourier ptychography;

- Superresolution microscopy;

- Optical sectioning

Dr. Emilio Sánchez-Ortiga
Guest Editor

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Sensors is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

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Further information on MDPI's Special Issue policies can be found here.

Published Papers (5 papers)

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Research

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9 pages, 3018 KiB  
Communication
Method for Film Thickness Mapping with an Astigmatic Optical Profilometer
by Hsien-Shun Liao, Shih-Han Cheng and En-Te Hwu
Sensors 2022, 22(8), 2865; https://doi.org/10.3390/s22082865 - 8 Apr 2022
Cited by 3 | Viewed by 2819
Abstract
An astigmatic optical profilometer is a precision instrument with advantages such as high resolution, high bandwidth, a compact size, and low cost. However, current astigmatic optical profilometers measure only surface morphology, and their potential for capturing subsurface information remains underutilized. In this study, [...] Read more.
An astigmatic optical profilometer is a precision instrument with advantages such as high resolution, high bandwidth, a compact size, and low cost. However, current astigmatic optical profilometers measure only surface morphology, and their potential for capturing subsurface information remains underutilized. In this study, we developed a method for measuring the thickness of transparent thin films with an astigmatic optical profilometer. Experimental results demonstrate that the thickness of transparent films tens of micrometers thick can be accurately measured. The maximum thickness measurable through our system is approximately 100 μm, which may be increased to 1.2 mm through the use of a scanner with a greater travel range. A coupling problem occurs for films <25 μm in thickness. However, to solve this problem, we devised a decoupling method, which was experimentally implemented to successfully measure a 18-μm-thick film. Moreover, the ability to obtain 3D images, including of both the upper and lower surfaces, was demonstrated. Full article
(This article belongs to the Special Issue Sensing, Computing and Imaging in 3D Microscopy)
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10 pages, 3051 KiB  
Article
Handheld and Cost-Effective Fourier Lightfield Microscope
by Laura Galdon, Hui Yun, Genaro Saavedra, Jorge Garcia-Sucerquia, Juan C. Barreiro, Manuel Martinez-Corral and Emilio Sanchez-Ortiga
Sensors 2022, 22(4), 1459; https://doi.org/10.3390/s22041459 - 14 Feb 2022
Cited by 7 | Viewed by 3621
Abstract
In this work, the design, building, and testing of the most portable, easy-to-build, robust, handheld, and cost-effective Fourier Lightfield Microscope (FLMic) to date is reported. The FLMic is built by means of a surveillance camera lens and additional off-the-shelf optical elements, resulting in [...] Read more.
In this work, the design, building, and testing of the most portable, easy-to-build, robust, handheld, and cost-effective Fourier Lightfield Microscope (FLMic) to date is reported. The FLMic is built by means of a surveillance camera lens and additional off-the-shelf optical elements, resulting in a cost-effective FLMic exhibiting all the regular sought features in lightfield microscopy, such as refocusing and gathering 3D information of samples by means of a single-shot approach. The proposed FLMic features reduced dimensions and light weight, which, combined with its low cost, turn the presented FLMic into a strong candidate for in-field application where 3D imaging capabilities are pursued. The use of cost-effective optical elements has a relatively low impact on the optical performance, regarding the figures dictated by the theory, while its price can be at least 100 times lower than that of a regular FLMic. The system operability is tested in both bright-field and fluorescent modes by imaging a resolution target, a honeybee wing, and a knot of dyed cotton fibers. Full article
(This article belongs to the Special Issue Sensing, Computing and Imaging in 3D Microscopy)
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12 pages, 20400 KiB  
Communication
The Lightfield Microscope Eyepiece
by Nicolò Incardona, Ángel Tolosa, Gabriele Scrofani, Manuel Martinez-Corral and Genaro Saavedra
Sensors 2021, 21(19), 6619; https://doi.org/10.3390/s21196619 - 5 Oct 2021
Cited by 5 | Viewed by 3477
Abstract
Lightfield microscopy has raised growing interest in the last few years. Its ability to get three-dimensional information about the sample in a single shot makes it suitable for many applications in which time resolution is fundamental. In this paper we present a novel [...] Read more.
Lightfield microscopy has raised growing interest in the last few years. Its ability to get three-dimensional information about the sample in a single shot makes it suitable for many applications in which time resolution is fundamental. In this paper we present a novel device, which is capable of converting any conventional microscope into a lightfield microscope. Based on the Fourier integral microscope concept, we designed the lightfield microscope eyepiece. This is coupled to the eyepiece port, to let the user exploit all the host microscope’s components (objective turret, illumination systems, translation stage, etc.) and get a 3D reconstruction of the sample. After the optical design, a proof-of-concept device was built with off-the-shelf optomechanical components. Here, its optical performances are demonstrated, which show good matching with the theoretical ones. Then, the pictures of different samples taken with the lightfield eyepiece are shown, along with the corresponding reconstructions. We demonstrated the functioning of the lightfield eyepiece and lay the foundation for the development of a commercial device that works with any microscope. Full article
(This article belongs to the Special Issue Sensing, Computing and Imaging in 3D Microscopy)
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12 pages, 3087 KiB  
Article
Error Analysis of the Combined-Scan High-Speed Atomic Force Microscopy
by Lu Liu, Ming Kong, Sen Wu, Xinke Xu and Daodang Wang
Sensors 2021, 21(18), 6139; https://doi.org/10.3390/s21186139 - 13 Sep 2021
Viewed by 2785
Abstract
A combined tip-sample scanning architecture can improve the imaging speed of atomic force microscopy (AFM). However, the nonorthogonality between the three scanners and the nonideal response of each scanner cause measurement errors. In this article, the authors systematically analyze the influence of the [...] Read more.
A combined tip-sample scanning architecture can improve the imaging speed of atomic force microscopy (AFM). However, the nonorthogonality between the three scanners and the nonideal response of each scanner cause measurement errors. In this article, the authors systematically analyze the influence of the installation and response errors of the combined scanning architecture. The experimental results show that when the probe in the homemade high-speed AFM moves with the Z-scanner, the spot position on the four-quadrant detector changes, thus introducing measurement error. Comparing the experimental results with the numerical and theoretical results shows that the undesired motion of the Z-scanner introduces a large error. The authors believe that this significant error occurs because the piezoelectric actuator not only stretches along the polarization direction but also swings under nonuniform multifield coupling. This article proposes a direction for further optimizing the instrument and provides design ideas for similar high-speed atomic force microscopes. Full article
(This article belongs to the Special Issue Sensing, Computing and Imaging in 3D Microscopy)
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Other

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9 pages, 2420 KiB  
Letter
Swept-Source-Based Chromatic Confocal Microscopy
by Dawoon Jeong, Se Jin Park, Hansol Jang, Hyunjoo Kim, Jaesun Kim and Chang-Seok Kim
Sensors 2020, 20(24), 7347; https://doi.org/10.3390/s20247347 - 21 Dec 2020
Cited by 9 | Viewed by 5786
Abstract
Chromatic confocal microscopy (CCM) has been intensively developed because it can exhibit effective focal position scanning based on the axial chromatic aberration of broadband light reflected from a target. To improve the imaging speed of three-dimensional (3D) surface profiling, we have proposed the [...] Read more.
Chromatic confocal microscopy (CCM) has been intensively developed because it can exhibit effective focal position scanning based on the axial chromatic aberration of broadband light reflected from a target. To improve the imaging speed of three-dimensional (3D) surface profiling, we have proposed the novel concept of swept-source-based CCM (SS-CCM) and investigated the usefulness of the corresponding imaging system. Compared to conventional CCM based on a broadband light source and a spectrometer, a swept-source in the proposed SS-CCM generates light with a narrower linewidth for higher intensity, and a single photodetector employed in the system exhibits a fast and sensitive response by immediately obtaining spectrally encoded depth from a chromatic dispersive lens array. Results of the experiments conducted to test the proposed SS-CCM system indicate that the system exhibits an axial chromatic focal distance range of approximately 360 μm for the 770–820 nm swept wavelength range. Moreover, high-speed surface profiling images of a cover glass and coin were successfully obtained with a short measurement time of 5 ms at a single position. Full article
(This article belongs to the Special Issue Sensing, Computing and Imaging in 3D Microscopy)
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