High-Frequency Spectroscopy and Imaging: Techniques and Applications
A special issue of Sensors (ISSN 1424-8220). This special issue belongs to the section "Sensing and Imaging".
Deadline for manuscript submissions: 15 February 2026 | Viewed by 200
Special Issue Editors
Interests: metamaterials for high-frequency applications; microwave components with a focus on RF MEMS and NEMS; microwave and millimeter wave components for space and security; scanning microwave microscopy for magnetic, semiconducting, and dielectric materials
Special Issues, Collections and Topics in MDPI journals
Interests: microwave measurements for cultural heritage applications; microwave tomography; RF MEMS
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
This Special Issue of Sensors was inspired by the success and ongoing advancements of high-frequency techniques for measuring materials' dielectric and magnetic properties, as well as imaging structures in many fields, encompassing medicine, cultural heritage, and material science.
An updated state of the art is proposed, and researchers in this area are invited to submit their contributions describing novel experimental configurations and image processing techniques.
High frequencies, ranging from the microwave to optical wavelengths of the electromagnetic spectrum, have been successfully utilized for decades in systems for telecommunication applications. The penetration of the waves depends on the operative frequencies, and the frequency choice allows the surface or sub-surface measurement of a sample's properties. This non-invasive approach provides valuable insights into material composition and the presence of inclusions. Microwaves, for instance, are widely employed in medicine and cultural heritage for measurements and treatments, operating at frequencies typically below a few GHz. However, material science also benefits from near-field measurements using purposely modified atomic force microscopy setups for the local investigation of materials.
The utilization of vector network analyzers (VNAs) for frequency domain measurements and experimental techniques based on time domain characterizations are both considered to investigate material surfaces and hidden image structures.
The possibility of processing the magnitude and phase of scattering parameters, i.e., the typical quantities recorded in high-frequency measurements, allows for richer information for image reconstruction and local property determination. While general concepts in spectroscopy and imaging can be applied across fields, the practical solutions and physical modeling differ significantly depending on whether micro- or macro-scale setups are used. In this Special Issue, contributions to novel concepts of spectroscopy and imaging based on high-frequency measurements and reconstruction algorithms are welcome
Dr. Romolo Marcelli
Dr. Emanuela Proietti
Guest Editors
Manuscript Submission Information
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Keywords
- high-frequency spectroscopy and imaging
- near-field microscopy
- dielectric constant measurement
- image reconstruction algorithms
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