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Photonics
Special Issues
Advancements in Optical Metrology and Imaging
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Advancements in Optical Metrology and Imaging

A special issue of Photonics (ISSN 2304-6732). This special issue belongs to the section "Optical Interaction Science".

Deadline for manuscript submissions: 31 August 2025 | Viewed by 950

Special Issue Editors

Dr. Yingying Wan

E-Mail Website
Guest Editor
School of Physical Science and Technology, Southwest Jiaotong University, No. 999, Xi'an Road, Pidu District, Chengdu 611756, China
Interests: optical 3D measurement; 3D sensing; computer vision
Dr. Ji Tan

E-Mail Website
Guest Editor
School of Automation, Guangdong University of Technology, No.100 Waihuanxi Road, Panyu District, Guangzhou 510006, China
Interests: optical 3D metrology; computational optical imaging; deep learning
Dr. Gaoxu Wu

E-Mail Website
Guest Editor
School of Mechanical and Electrical Engineering, Jiangxi University of Science and Technology, No.1958 Kejia Road, Jingkai District, Ganzhou 341000, China
Interests: optical 3D metrology; mechanical vision; optical mechanical inspection

Special Issue Information

Dear Colleagues,

Optical metrology and imaging are at the forefront of technological innovation, enabling precise measurements and high-resolution imaging across various fields. This Special Issue is dedicated to exploring research that advances the state of the art in these fields and will cater to contributions that address challenges in measurement accuracy, imaging resolution, and the integration of optical technologies with other disciplines. This Special Issue seeks to present research that will not only enhance our understanding of optical metrology but also drive innovation in applications critical to industries like manufacturing, healthcare, and train traffic. We are pleased to invite you to submit your recent work that spans from theoretical developments to practical applications related to optical metrology and imaging. In this Special Issue, original research articles and reviews are welcome. Research areas may include (but are not limited to) the following: optical measurement, 3D/2D imaging, computational imaging, image processing, optical and visual inspection for surface defects, and deep learning and machine learning applications related to optical imaging techniques.

We look forward to receiving your contributions.

Dr. Yingying Wan
Dr. Ji Tan
Dr. Gaoxu Wu
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Photonics is an international peer-reviewed open access monthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • optical measurement
  • 3D/2D imaging
  • computational imaging
  • image processing
  • optical inspection
  • deep learning and machine learning

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Further information on MDPI's Special Issue policies can be found here.

Published Papers (2 papers)

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Research

15 pages, 12373 KiB  
Article
Vibration Deformation Measurement and Defect Identification Based on Time-Averaged Digital Holography
by Dongyang Hu, Chen Wang, Di Li, Weiyu Xu and Xiangchao Zhang
Photonics 2025, 12(4), 373; https://doi.org/10.3390/photonics12040373 - 13 Apr 2025
Viewed by 303
Abstract
Based on time-averaged digital holography, a vibration deformation measurement system was designed and a full process reconstruction and identification strategy was developed for detecting the micro-defects in optical materials. Through the double beam expansion setting and off-axis imaging adjustments, it is suitable for [...] Read more.
Based on time-averaged digital holography, a vibration deformation measurement system was designed and a full process reconstruction and identification strategy was developed for detecting the micro-defects in optical materials. Through the double beam expansion setting and off-axis imaging adjustments, it is suitable for measuring optical materials with non-specular surfaces by double exposure shots. The scheme was applied to optical sandwich composites and 3D printed glass. Abnormal amplitudes occur at the defects due to different resonance frequencies, resulting in anomalous vibrations under excitation, and the differences in the amplitudes and phases before and after vibration can effectively characterize vibration amplitude and subsurface defects, proving that this method has a high detecting sensitivity. Full article
(This article belongs to the Special Issue Advancements in Optical Metrology and Imaging)
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20 pages, 12269 KiB  
Article
Research on Single-Shot Wrapped Phase Extraction Using SEC-UNet3+
by Lijun Deng, Rui Chen, Yang Xu, Wenxiang Liu, Wenrui Guan, Yiwen Hu, Xingyan Huang and Zhihua Xie
Photonics 2025, 12(4), 369; https://doi.org/10.3390/photonics12040369 - 11 Apr 2025
Viewed by 202
Abstract
Phase demodulation is the core of fringe projection profilometry systems. However, current U-Net-based phase demodulation approaches demonstrate deficiencies in global context propagation, adversely affecting wrapped phase extraction precision. To this end, this paper proposes a deep-learning-based model for single-shot wrapped phase extraction, named [...] Read more.
Phase demodulation is the core of fringe projection profilometry systems. However, current U-Net-based phase demodulation approaches demonstrate deficiencies in global context propagation, adversely affecting wrapped phase extraction precision. To this end, this paper proposes a deep-learning-based model for single-shot wrapped phase extraction, named the full-scale connection and attention enhancement network (SEC-UNet3+). The network mitigates the limitations of the traditional U-Net architecture by introducing cross-layer full-scale connection and a feature integration module in the decoder, enabling efficient interaction between shallow detail features and deep semantic features. Unlike the skip connection strategy within the same-layer in U-Net, cross-layer full-scale connection can enhance the feature utilization. Additionally, a skip connection is embedded between the feature mapping layer and the output transformation layer in the squeeze and excitation module, preventing information loss during the feature calibration process. Compared to the U-Net model, the proposed method achieves an approximately 5% to 15% reduction in both the mean squared error and mean absolute error for phase extraction. The experimental results confirm that SEC-UNet3+ outperforms traditional Fourier transform and mainstream U-Net-based approaches in phase demodulation accuracy, proving particularly effective for single-shot wrapped phase retrieval in dynamic scenarios. Full article
(This article belongs to the Special Issue Advancements in Optical Metrology and Imaging)
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