Artificial Intelligence for Semiconductor Devices and Processes Technology: Theories, Methods and Applications

A Special Issue of Micromachines (ISSN 2072-666X) belonging to the section "D1: Semiconductor Devices".

Deadline for manuscript submissions: 31 August 2027 | Viewed by 84

Editor

Special Issue Information

Dear Colleagues,

The rapid advancement of artificial intelligence (AI) has driven transformative progress in the semiconductor field, addressing key bottlenecks of conventional trial-and-error methods in micro/nano device design, fabrication, and characterization. Core AI techniques, including data mining, machine learning, deep learning, and multi-agent intelligent systems, have proven to be powerful in solving critical technical challenges across semiconductor engineering.

This Special Issue focuses on cutting-edge AI-enabled innovations for semiconductor engineering, welcoming original research papers and reviews that bridge AI theories and practical semiconductor applications. The scope covers the full semiconductor technical chain, including intelligent device and circuit modeling, AI-optimized wafer fabrication, intelligent defect inspection for packaging and testing, and enhanced reliability prediction of semiconductor systems.

We invite high-quality submissions concerning AI algorithm optimization, methodological innovation, and practical engineering implementations for semiconductor development. Original studies featuring novel intelligent strategies and scalable industrial verification are highly encouraged.

Prof. Dr. Ping-Feng Pai
Guest Editor

Manuscript Submission Information

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Keywords

  • artificial intelligence
  • semiconductor devices
  • semiconductor manufacturing
  • micro/nano devices
  • process optimization
  • defect detection
  • reliability prediction
  • intelligent modeling

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Published Papers

This special issue is now open for submission.
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