Synthesis and Properties of Metallic Multilayers
A special issue of Metals (ISSN 2075-4701).
Deadline for manuscript submissions: closed (31 January 2019) | Viewed by 7491
Special Issue Editor
Interests: nitrides; carbides; sputter deposition; ion-assisted deposition; wear; friction; tool coatings
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
Metallic multilayers can be defined as artificially synthesized materials consisting of periodic alternating layers of two distinct metallic components. Multilayer samples can be synthesized by a variety of methods, including sputter deposition, electrochemical deposition, and accumulative roll bonding. A primary characteristic of multilayers is the combined thickness of two layers (one bilayer) commonly referred to as the multilayer wavelength, which can range from a few nanometers to several microns. Another important characteristic of multilayers is the extent of crystallographic coherency between layers, which can lead to strained layers, partially coherent layers with extensive interfacial dislocation networks, or incoherent interfaces. The nature of the interface is strongly dependent on the deposition parameters and fabrication methods, and understanding this process/structure relationship is an important area of research. The mechanical properties of metallic multilayers continue to receive strong interest from the research community along with magnetic properties (particularly for alternating ferromagnetic/paramagnetic components). Multilayer applications of interest include X-ray mirrors and foils used for brazing applications using self-propagating reactions.
This Special Issue aims to present the latest research results in the area of synthesis, processing, properties and characterization of multilayer structures. The focus is on systems where at least one of the components in the multilayer is a metallic component. Studies of the constituent layers, such as research on the structure interfaces in bilayer samples, are also welcome.
Prof. Dr. James E. Krzanowski
Guest Editor
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Keywords
- Multilayer materials
- Artificial superlattices
- Thin-film interfaces
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