materials-logo

Journal Browser

Journal Browser

Novel Functional Luminescent Materials: From Mechanisms to Applications

A Special Issue of Materials (ISSN 1996-1944) belonging to the section "Optical and Photonic Materials".

Deadline for manuscript submissions: 20 May 2027 | Viewed by 1907

Editors


E-Mail Website
Guest Editor
School of Materials Science and Engineering, Shanghai University, Shanghai 200444, China
Interests: radiation detection materials; X-ray detection; α particle detection; high-repetition-rate electron beam detection; zinc oxide materials; perovskite materials; radiation photoluminescent materials
Special Issues, Collections and Topics in MDPI journals

E-Mail Website
Co-Guest Editor
School of Materials Science and Engineering, Shanghai University, Shanghai 200444, China
Interests: microstructure control and optical properties of lutetium-silicon composite oxide ceramics; transparent conductive dual-functional mayenite ceramics; solid-state electrolyte ceramics

Special Issue Information

Dear Colleagues,

In recent years, luminescent materials, with their unique photophysical properties and dynamic response characteristics, such as photoluminescent materials, stress luminescence, and electro-luminescent materials, have become key carriers driving the integration of multiple disciplines. From novel display and lighting technologies, biomedicine to environmental energy and information technology, the innovation of luminescent materials is constantly expanding the boundaries of human understanding and technology. This Special Issue aims to deeply explore the diversity of luminescent material mechanisms, new applications, and future challenges, sincerely inviting scholars dedicated to this field to share their latest research achievements and insights.

Dr. Qianli Li
Dr. Lingcong Fan
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 250 words) can be sent to the Editorial Office for assessment.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-anonymized peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Materials is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • luminescent materials
  • phosphors
  • optoelectronic materials
  • photophysics
  • sensors
  • bioimaging
  • organic light-emitting diodes
  • quantum dots

Benefits of Publishing in a Special Issue

  • Ease of navigation: Grouping papers by topic helps scholars navigate broad scope journals more efficiently.
  • Greater discoverability: Special Issues support the reach and impact of scientific research. Articles in Special Issues are more discoverable and cited more frequently.
  • Expansion of research network: Special Issues facilitate connections among authors, fostering scientific collaborations.
  • External promotion: Articles in Special Issues are often promoted through the journal's social media, increasing their visibility.
  • Reprint: MDPI Books provides the opportunity to republish successful Special Issues in book format, both online and in print.

Further information on MDPI's Special Issue policies can be found here.

Published Papers (3 papers)

Order results
Result details
Select all
Export citation of selected articles as:

Research

Jump to: Review

22 pages, 24675 KB  
Article
Fabrication of Li/In Double-Sided Diffusion Contacts in Planar High-Purity Germanium Detectors and Their Low-Temperature X-Ray Response
by Meng Cao, Zexin Wang, Yanggang Jia, Qingzhi Hu, Zhaoran Guan, Haofei Huang, Linjun Wang and Jian Huang
Materials 2026, 19(14), 3143; https://doi.org/10.3390/ma19143143 - 22 Jul 2026
Viewed by 383
Abstract
Li n+ and In p+ diffusion contacts were fabricated on p-type 12N high-purity germanium (HPGe) single crystals by vacuum evaporation of thin-film sources followed by solid-state thermal diffusion. The effects of diffusion temperature on the near-surface structure, morphology, impurity distribution, and [...] Read more.
Li n+ and In p+ diffusion contacts were fabricated on p-type 12N high-purity germanium (HPGe) single crystals by vacuum evaporation of thin-film sources followed by solid-state thermal diffusion. The effects of diffusion temperature on the near-surface structure, morphology, impurity distribution, and device response were systematically investigated. XRD and Raman analyses show that Li diffusion at 100–300 °C and In diffusion at 600–800 °C preserve the bulk Ge crystal structure, whereas higher diffusion temperatures induce surface roughening, near-surface disordering, and interfacial reactions. SIMS depth profiles combined with diffusion simulations confirm effective inward diffusion of both Li and In, with low-concentration tailing that is consistent with defect-assisted diffusion or interfacial trapping. The sample diffused with Li at 200 °C exhibits the lowest dark current, 8.07 × 10−8 A at −10 V. The final HPGe device with Li/In diffusion contacts shows a stable synchrotron X-ray photoconductive response, and the net response current increases from 4.48 × 10−7 to 1.15 × 10−6 A as the incident photon flux increases. These results demonstrate that low-leakage HPGe diffusion contacts require a balance between diffusion-layer formation and near-surface/interface stability, rather than a simple increase in thermal budget. Full article
Show Figures

Figure 1

18 pages, 13481 KB  
Article
Junction Formation and Leakage Current Suppression in Planar High-Purity Germanium Detectors for Low-Energy X-Ray Detection
by Meng Cao, Qingzhi Hu, Yanggang Jia, Zexin Wang, Zhaoran Guan, Haofei Huang, Linjun Wang and Jian Huang
Materials 2026, 19(14), 3008; https://doi.org/10.3390/ma19143008 - 13 Jul 2026
Viewed by 389
Abstract
This study addresses the need for dark-current control and stable current response in planar high-purity germanium (HPGe) detectors for low-energy X-ray detection. A device fabrication strategy based on the coupled optimization of near-surface treatment, N/P junction formation, and guard-ring electrode design is proposed. [...] Read more.
This study addresses the need for dark-current control and stable current response in planar high-purity germanium (HPGe) detectors for low-energy X-ray detection. A device fabrication strategy based on the coupled optimization of near-surface treatment, N/P junction formation, and guard-ring electrode design is proposed. Unlike previous studies that mainly focused on contact-layer fabrication, segmented electrode structures, low-noise readout, or response simulation, this work investigates low-damage near-surface construction, N-type and P-type contact-layer formation, and edge-related leakage-current regulation as an interconnected processing route. The relationship among the near-surface state, junction quality, electrode configuration, and edge-related leakage current is emphasized. Chemical mechanical polishing (CMP) reduced the surface roughness Sa of the HPGe crystal to 6.68 nm, providing a low-damage near-surface foundation for subsequent junction fabrication. On this basis, the optimized Li thermal diffusion process, namely 0.5 Å s−1, 325 °C, and 5 min, formed an N-type contact layer with preserved lattice ordering and favorable electrical properties. B ion implantation combined with rapid thermal processing (RTP) achieved acceptor activation and implantation-damage recovery, and the condition with Rp = 198.1 nm showed relatively better structural recovery and electrical characteristics. After introducing the guard-ring electrode, the dark current of the device at −20 V decreased from 6.5 × 10−9 A to 2.03 × 10−9 A, and a stable switching current response was obtained under 12 keV monochromatic synchrotron X-ray irradiation. Geant4 simulations were further used as an auxiliary analysis to evaluate the effect of the guard-ring structure on the simulated response spectra and full-energy peak efficiency (FEPE) for low-energy X-rays. Overall, this study provides experimental evidence for process optimization of planar HPGe detectors with low dark current and stable low-energy current response. Full article
Show Figures

Figure 1

Review

Jump to: Research

15 pages, 1892 KB  
Review
Ag-Doped Phosphate Glass: Structure, Radio-Photoluminescence and Applications
by Meng Gu, Yaqi Peng, Xue Yang, Deyu Zhao, Yanshuo Han, Yihan Chen, Naixin Li, Kuan Ren, Jingtai Zhao and Qianli Li
Materials 2026, 19(11), 2204; https://doi.org/10.3390/ma19112204 - 23 May 2026
Viewed by 525
Abstract
Radiation detection technology is critical in medical diagnosis, high-energy physics experiments, nuclear environmental monitoring, and radiation safety protection. Its technological iteration stems from innovations in high-performance radiation detection materials. Traditional materials often have narrow dose–response intervals, insufficient high-precision measurement capability, low spatial resolution, [...] Read more.
Radiation detection technology is critical in medical diagnosis, high-energy physics experiments, nuclear environmental monitoring, and radiation safety protection. Its technological iteration stems from innovations in high-performance radiation detection materials. Traditional materials often have narrow dose–response intervals, insufficient high-precision measurement capability, low spatial resolution, and poor stability, failing to meet high-precision detection requirements. Ag-doped phosphate glass (Ag-PG), based on radio-photoluminescence (RPL), effectively addresses these limitations with its comprehensive advantages: high radiation sensitivity, a wide linear dose–response range, submicron spatial resolution for radiation imaging, write-erase-rewrite capability, and visualized dose monitoring potential, and it also boasts significant fundamental research value and engineering application prospects. Specifically, while existing RPL reviews mainly provide a comprehensive analysis from the perspective of RPL and present typical RPL material systems, this paper systematically analyzes the structural characteristics of the Ag-PG matrix and the coordination configuration and site occupation of Ag ions. It clarifies RPL luminescence properties, dose–response mechanisms, and the evolution of luminescence centers, while reviewing advancements in applications such as radiation dose detection and high-resolution X-ray imaging. By summarizing the current research status, technical advantages and existing challenges of Ag-PG, this study provides theoretical references and conceptual insights to promote breakthroughs in its fundamental research and practical applications in high-precision radiation dose detection, advanced medical imaging, micro-nano-scale radiation detection, and nuclear industry non-destructive testing. Full article
Show Figures

Figure 1

Back to TopTop