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Imaging Based Material Characterization of Electronics and Their Applications

This special issue belongs to the section "Electronic Materials, Devices and Applications".

Special Issue Information

Keywords

  • Complex/functional materials,
  • New imaging method development, Combination of multiple supplemental characterization,
  • Eco-design, Recycling, Material Processing
  • Process optimization/intensification
  • Multiphase flows (e.g. liquid-gas flows, liquid-solid flows)
  • Neutrons, X-rays
  • In-situ/Operando measurement
  • Tomography/radiography
  • Magnetic resonance imaging
  • Automated image analysis
  • Electron microscope (e.g. SEM, TEM)
Graphical abstract

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Published Papers

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Electronics - ISSN 2079-9292