Advanced Machine Learning, Pattern Recognition, and Deep Learning Technologies: Methodologies and Applications, 2nd Edition
A special issue of Electronics (ISSN 2079-9292). This special issue belongs to the section "Computer Science & Engineering".
Deadline for manuscript submissions: 15 January 2026 | Viewed by 246
Special Issue Editors
Interests: machine learning; biometrics; data mining; image processing
Special Issues, Collections and Topics in MDPI journals
Interests: machine learning; data mining; pattern recognition; computer vision
Special Issues, Collections and Topics in MDPI journals
Interests: anomaly detection; multimedia analysis; object detection; image/video compression; deep learning
Special Issues, Collections and Topics in MDPI journals
Interests: biometrics; pattern recognition; image processing; medical image analysis
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
In recent years, machine learning, pattern recognition, and deep learning techniques have been successfully applied to science and engineering research. For example, biometric recognition, i.e., the recognition of palmprints, faces, and irises, has enabled personal security authentication for airports, banks, and online payments. These techniques have also allowed us to retrieve the information we are interested in from the internet. Furthermore, image processing technology can help us obtain more beautiful photos. Deep learning, in particular, has a powerful ability to extract discriminant patterns and make accurate predictions from large-scale databases. However, the performances of machine learning, pattern recognition, and deep learning algorithms rely significantly on model design, mathematical interpretation, and optimization. A good fusion of theories and models is crucial to the success of the applications listed above. The aim of this Special Issue is to highlight recent advances in machine learning, pattern recognition, and deep learning methodologies and theories. Papers with interesting/significant new applications of the abovementioned methods are also welcome. The topics of interest for this Special Issue include, but are not limited to, the following:
- Advanced machine intelligence methods and applications;
- Advanced pattern analysis methods and applications;
- Deep-learning-based methods and applications;
- Biometric recognition algorithms and applications;
- Multi-view/modal learning and fusion;
- Data mining and analysis;
- Hashing learning-based methods and applications;
- Dimensionality reduction and discriminant representation;
- Subspace learning and clustering;
- Graph learning-based methods and applications;
- Super-resolution/enhancement/restoration of images;
- Advanced models within computer vision, such as object tracking and detection;
- Sparse representations and their applications.
Dr. Shuping Zhao
Dr. Jie Wen
Dr. Chao Huang
Dr. Bob Zhang
Guest Editors
Manuscript Submission Information
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Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Electronics is an international peer-reviewed open access semimonthly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- artificial intelligence
- machine learning
- pattern recognition
- deep learning
- mathematical optimization
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